Test apparatus and setting method therefor

Abstract

A test apparatus for testing an electric device includes a plurality of signal input-output units for inputting and/or outputting test signals in response to each of a plurality of terminals included by the electric device, a channel selection memory for storing pieces of channel selection information indicating whether each of the signal input-output units should perform setting based on a setting condition or not, a setting condition memory for storing the setting condition with regard to the signal input-output unit, and a controlling means for retrieving and supplying the setting condition stored in the setting condition memory and the channel selection information stored in the channel selection memory to the signal input-output units based on a setting instruction, when receiving the setting instruction to set the setting condition of the signal input-output unit, wherein when at least one of the signal input-output units is selected by the channel selection information supplied from the controlling means, the one of the signal input-output units is set based on the setting condition supplied from the controlling means.

1 - 7 . (canceled)  
   
   
       8 . A test module used in a test apparatus for testing an electric device, comprising: 
 a plurality of signal input-output units for: generating a test signal inputted to said electric device, comparing a signal outputted from said electric device in response to the test signal inputted with an expected signal, and inputting and/or outputting test signals in response to each of a plurality of terminals of said electric device when set according to a setting condition provided for performing a test;    a channel selection memory for storing pieces of channel selection information indicating whether each of said signal input-output units should perform a setting based on a setting condition in advance of starting the testing;    a setting condition memory for storing said setting condition with regard to said signal input-output unit in advance of starting the testing; and    a controlling means for retrieving and supplying said setting condition stored in said setting condition memory and said channel selection information stored in said channel selection memory to said signal input-output units based on a setting instruction, when receiving said setting instruction to set said setting condition of said signal input-output unit,    wherein when at least one of said signal input-output units is selected by said channel selection information supplied from said controlling means, said one of said signal input-output units is set based on said setting condition supplied from said controlling means,    wherein said test module corresponds to said electric device having a unique test pattern.    
   
   
       9 . A test module used in a test apparatus as claimed in  claim 8 , wherein said setting condition memory stores said setting condition of said signal input-output unit and an address of said channel selection memory in a corresponding manner, and said controlling means comprises: 
 a setting condition retrieving unit for retrieving said setting condition and said address of said channel selection memory from said setting condition memory;    a selection information retrieving unit for retrieving said channel selection information from said channel selection memory based on said address of said channel selection memory retrieved by said setting condition retrieving unit; and    a setting condition supplying unit for supplying said setting condition retrieved by said setting condition retrieving unit and said channel selection information retrieved by said selection information retrieving unit to said signal input-output units.    
   
   
       10 . A test module used in a test apparatus as claimed in  claim 9  further comprising: 
 a plurality of test modules, each of which comprises: 
 said plurality of signal input-output units;  
 said channel selection memory;  
 said setting condition memory;  
 said setting condition retrieving unit;  
 said selection information retrieving unit; and  
 said setting condition supplying unit, and  
   a test processor for supplying said test modules with said setting instruction to set said setting conditions of said signal input-output units,    wherein said setting condition memories comprised respectively by said test modules store different setting conditions in areas of a same address, said setting condition retrieving units retrieve said different setting conditions respectively from said setting condition memories based on said address of said setting condition memory comprised by said setting instruction supplied from said test processor, and said setting condition supplying units supply said setting conditions retrieved by said setting condition retrieving units respectively to said signal input-output units.    
   
   
       11 . A method for setting a setting condition of at least one of signal input-output units in a test module used in a test apparatus for inputting and/or outputting test signals in response to each of a plurality of terminals of an electric device, comprising the steps of: 
 retrieving said setting condition of said signal input-output unit from a setting condition memory in advance of performing a test;    retrieving channel selection information indicating whether each of said signal input-output units should perform a setting based on said setting condition from a channel selection memory in advance of performing the test;    supplying said setting condition retrieved from said setting condition memory and said channel selection information retrieved from said channel selection memory to said signal input-output units;    setting at least one of said signal input-output units based on said setting condition supplied, when said signal input-output unit is selected by said channel selection information supplied; and    generating a test signal inputted to said electric device, comparing a signal outputted from said electric device in response to the test signal inputted with an expected signal, and inputting and/or outputting test signals in response to each of a plurality of terminals of said electronic device when the at least one of said signal input-output units is set according to a setting condition provided for performing the test,    wherein said test module corresponds to said electric device having a unique test pattern.    
   
   
       12 . A testing apparatus for testing an electric device, comprising: 
 a test processor;    a bus;    a test module connecting with said test processor via said bus, comprising:    a plurality of signal input-output units for generating a test signal inputted to said electronic device, comparing a signal outputted from said electric device in response to the test signal inputted with an expected signal and inputting and/or outputting test signals in response to each of a plurality of terminals of said electric device when set according to a setting condition provided for performing a test;    a channel selection memory for storing pieces of channel selection information indicating whether each of said signal input-output units should perform a setting based on a setting condition in advance of starting the test;    a setting condition memory for storing said setting condition with regard to said signal input-output unit in advance of starting the test; and    a controlling means for retrieving and supplying said setting condition stored in said setting condition memory and said channel selection information stored in said channel selection memory to said signal input-output units based on a setting instruction, when receiving said setting instruction to set said setting condition of said signal input-output unit,    wherein when at least one of said signal input-output units is selected by said channel selection information supplied from said controlling means, said one of said signal input-output units is set based on said setting condition supplied from said controlling means,    wherein said test module corresponds to said electric device having a unique test pattern.    
   
   
       13 . A test apparatus as claimed in  claim 12 , wherein said setting condition memory stores said setting condition of said signal input-output unit and an address of said channel selection memory in a corresponding manner, and said controlling means comprises: 
 a setting condition retrieving unit for retrieving said setting condition and said address of said channel selection memory from said setting condition memory;    a selection information retrieving unit for retrieving said channel selection information from said channel selection memory based on said address of said channel selection memory retrieved by said setting condition retrieving unit; and    a setting condition supplying unit for supplying said setting condition retrieved by said setting condition retrieving unit and said channel selection information retrieved by said selection information retrieving unit to said signal input-output units.    
   
   
       14 . A test apparatus as claimed in  claim 13  further comprising: 
 a plurality of test modules, each of which comprises: 
 said plurality of signal input-output units;  
 said channel selection memory;  
 said setting condition memory;  
 said setting condition retrieving unit;  
 said selection information retrieving unit; and  
 said setting condition supplying unit, and  
   a test processor for supplying said test modules with said setting instruction to set said setting conditions of said signal input-output units,    wherein said setting condition memories comprised respectively by said test modules store different setting conditions in areas of a same address, said setting condition retrieving units retrieve said different setting conditions respectively from said setting condition memories based on said address of said setting condition memory comprised by said setting instruction supplied from said test processor, and said setting condition supplying units supply said setting conditions retrieved by said setting condition retrieving units respectively to said signal input-output units.