US2006287188A1PendingUtilityA1
Manganese doped barium titanate thin film compositions, capacitors, and methods of making thereof
Est. expiryJun 21, 2025(expired)· nominal 20-yr term from priority
H10P 14/6529H10P 14/69398H01G 4/33H05K 2201/0179C01P 2004/82H05K 2201/0175H05K 2201/0355H01G 4/1227C01G 23/006C01P 2006/40H05K 1/162Y10T428/31678Y10T29/435Y10T29/4913H01G 4/12H01G 4/10
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Claims
Abstract
The present invention is directed to a dielectric thin film composition comprising: (1) one or more barium/titanium-containing selected from (a) barium titanate, (b) any composition that can form barium titanate during firing, and (c) mixtures thereof; dissolved in (2) organic medium; and wherein said thin film composition is doped with 0.002 to 0.05 atom percent of a manganese-containing additive.
Claims
exact text as granted — not AI-modified1 . A dielectric thin film composition comprising:
(1) One or more barium/titanium-containing additives selected from the group consisting of (a) barium titanate, (b) any composition that can form barium titanate during firing, and (c) mixtures thereof; dissolved in (2) organic medium; and wherein said thin film composition is doped with 0.002 to 0.05 atom percent of a manganese-containing additive.
2 . The composition of claim 1 wherein the barium in said barium/titanium-containing additive has been partially or substantially replaced by one or more metal cations having the oxide stoichiometry of MO wherein M is selected from the group consisting of (a) strontium; (b) lead; (c) calcium; and (d) mixtures thereof.
3 . The composition of claim 1 wherein the titanium in said barium/titanium-containing additive has been partially or substantially replaced by one or more metal cations having the oxide stoichiometry of MO 2 wherein M is selected from the group consisting of (a) zirconium; (b) hafnium; (c) tin; and (d) mixtures thereof.
4 . A capacitor comprising the thin film composition of claim 1 wherein said thin film composition has been fired in a reducing atmosphere without the need for reoxidation.
5 . An innerlayer panel comprising the capacitor of claim 4 .
6 . A printed wiring board comprising the capacitor of claim 4 .
7 . A method of making a capacitor comprising:
providing a metallic foil; forming a dielectric over the metallic foil, wherein forming the dielectric comprises:
forming a dielectric layer over the foil wherein the dielectric layer is formed from the composition of claim 1;
annealing the dielectric layer; and
forming a conductive layer over the dielectric, wherein the metallic foil, the dielectric, and the conductive layer form the capacitor.
8 . The method of claim 7 , wherein annealing comprises annealing at a temperature in the range of about 800 to 1050° C.
9 . The method of claim 7 , wherein annealing comprises annealing in an environment having an oxygen partial pressure of less than about 10 −8 atmospheres.
10 . The method of claim 7 , wherein annealing results in a dielectric comprising crystalline barium titanate or crystalline barium strontium titanate.
11 . The method of claim 7 , wherein the capacitor has a capacitance density of at least 0.5 μF/cm 2 .Cited by (0)
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