US2007001300A1PendingUtilityA1

Semiconductor device

Assignee: HITACHI TOBU SEMICONDUCTOR LTDPriority: Jul 6, 1998Filed: Jun 13, 2006Published: Jan 4, 2007
Est. expiryJul 6, 2018(expired)· nominal 20-yr term from priority
H10W 72/555H10W 72/522H10W 72/552H10W 42/265H10W 70/682H10W 70/655H10W 72/884H10W 72/5445H10W 90/754H10W 72/547H10W 72/5475H10W 72/5473H10W 72/07554H10W 72/59H10W 72/50H10W 72/521H10W 72/07552H10W 72/932H10W 70/60H10W 44/216H10W 44/234H10W 44/226H10W 44/206H10W 90/00H10W 72/951H10W 72/075H10W 44/20H10W 44/501H10W 42/20H10W 70/65H10W 70/685H10W 70/658H10W 70/657H10W 76/12H10W 72/90H03F 1/56H03F 3/213H05K 1/0298H05K 1/183H03F 2200/411H05K 1/0243H03F 2200/318H03F 2200/222H03F 2200/255H03F 2200/168H03F 2200/543H03F 3/604H03F 2200/12H03F 2200/408H03F 2200/423H03F 2200/451H03H 7/383H05K 3/403H03F 2200/387H03F 3/195H10W 72/5525
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Claims

Abstract

In a semiconductor device such as a high-frequency power amplifier module, a plurality of amplifying means are formed on a semiconductor chip which is mounted on a main surface of a wiring substrate, and electrodes of the semiconductor chip are electrically connected by wires to electrodes of the wiring substrate. In order to make the high-frequency power amplifier module small in size, a substrate-side bonding electrode electrically connected to a wire set at a fixed reference electric potential is place at a location farther from a side of the semiconductor chip than a substrate-side output electrode electrically connected to an output wire. A substrate-side input electrode electrically connected to an input wire is located at a distance from the side of the semiconductor chip about equal to the distance from the side of the semiconductor chip to the substrate-side output electrode, or at a location farther from the side of the semiconductor chip than the substrate-side bonding electrode is.

Claims

exact text as granted — not AI-modified
1 . A semiconductor device comprising: 
 a semiconductor chip having a square surface;    a wiring substrate having a main surface thereof used for mounting said semiconductor chip;    a first electrode formed on a first area of a main surface of said semiconductor chip and placed at a location in close proximity to a side of said semiconductor chip;    first amplifying means formed on said first area of said main surface of said semiconductor chip and provided with an input unit electrically connected to said first electrode;    a second electrode formed on a second area of said main surface of said semiconductor chip and placed at a location in close proximity to said side of said semiconductor chip;    second amplifying means formed on said second area of said main surface of said semiconductor chip and provided with an output unit electrically connected to said second electrode;    a third electrode formed on a third area between said first and second areas of said main surface of said semiconductor chip;    a fourth electrode formed on said main surface of said wiring substrate to face said side of said semiconductor chip and electrically connected to said first electrode by a first wire;    a fifth electrode formed on said main surface of said wiring substrate to face said side of said semiconductor chip and electrically connected to said second electrode by a second wire; and    a sixth electrode formed on said main surface of said wiring substrate to face said side of said semiconductor chip and electrically connected to said third electrode by a third wire with an electric potential thereof fixed at a reference level,    wherein said sixth electrode is placed at a location farther from said side of said semiconductor chip than said fifth electrode.    
     
     
         2 - 17 . (canceled)

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