US2007037418A1PendingUtilityA1
Process of forming socket contacts
Est. expiryMar 10, 2019(expired)· nominal 20-yr term from priority
Y10T29/49144Y10T29/49165Y10T29/53174G01R 1/0483H05K 7/1061G01R 1/0466Y10T29/4914Y10T29/49174Y10T29/49117H01R 2201/20Y10T29/4913Y10T29/49128Y10T29/49126Y10T29/49224Y10T29/49155H01R 13/2421Y10T29/49204Y10T29/49139Y10T29/49151Y10T29/49149Y10T29/49222H01R 12/714Y10T29/49153
51
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Claims
Abstract
A socket contact formation process comprises forming a contact head from a conductive material, forming a contact body from a semiconductive material configured to be electrically conductive; and joining the contact head and the contact body.
Claims
exact text as granted — not AI-modified1 . An electrical connector, comprising:
an elongated conductive body defining a central axis and having an end; an electrically conductive annular portion at said end concentric to said central axis; an electrically conductive frustoconical portion extending inward from said annular portion toward said central axis; and an electrically conductive planar portion below said annular portion, concentric to said central axis, and coupled to said frustoconical portion.
2 . The electrical connector in claim 1 , wherein said body comprises a pogo pin.
3 . A socket contact head, comprising:
a flat area; a sidewall extending upward and outward from said flat area; and a perimeter portion extending outward from said sidewall; wherein a selection of said flat area, said sidewall, said perimeter portion, and combinations thereof is configured to receive an IC chip contact and further configured to transmit an electrical signal along a socket contact body.
4 . The socket contact head of 3 , wherein said sidewall comprises a plurality of planar walls.
5 . The socket contact head of claim 4 , wherein said sidewall comprises:
a first planar wall; a second planar wall coupled to said first planar wall; and a third planar wall coupled to said first planar wall and said second planar wall.
6 . An electrically conductive contact head, comprising:
an upper portion defining an opening; a sidewall coupled to said upper portion at a first transition area and decliningly converging from said first transition area; a lower portion coupled to said sidewall at a second transition area; and an electrical connection contact area at a selection of said upper portion, said sidewall, said lower portion, and combinations thereof; wherein a selection of said upper portion, said sidewall, said lower portion, and combinations thereof is configured to contact a socket contact body.
7 . The electrically conductive contact head in claim 6 , wherein said electrical connection contact area defines a circle along said sidewall.
8 . The electrically conductive contact head in claim 6 , wherein said electrical connection contact area defines a plurality of points along said sidewall.
9 . The electrically conductive contact head in claim 6 , wherein said electrical connection contact area comprises:
at least a circle along said sidewall; and at least a point on said lower portion.
10 . The electrically conductive contact head in claim 6 , wherein said electrical connection contact area coincides with at least a portion of said upper portion.
11 . The electrically conductive contact head in claim 6 , wherein said electrical connection contact area coincides with said first transition area.
12 . The electrically conductive contact head in claim 11 , wherein said first transition area is rounded.
13 . A receptacle for an IC chip contact, comprising:
a metal layer having a shape that is at least generally complimentary to said IC chip contact, wherein said layer comprises:
an outer surface,
a curved middle surface transitioning from said outer surface, and
a curved inner surface transitioning from said middle surface; and
a conductive material in electrical communication with said metal layer and extending generally unidirectionally from said metal layer.
14 . The receptacle in claim 13 , wherein said outer surface comprises a curved surface.
15 . An electrical connection device, comprising:
a head defining an inner frustum-shaped recess and sized to accommodate an IC chip contact; and a resilient body coupled to said head.
16 . The electrical connection device of claim 15 , wherein said resilient body comprises:
a doped semiconductor shaft; and an elastomer material contacting said shaft.
17 . The electrical connection device of claim 15 , wherein said resilient body comprises a compressible metallic element.
18 . The electrical connection device of claim 17 , wherein said resilient body comprises a tube defining at least one aperture therein.
19 . The electrical connection device of claim 17 , wherein said resilient body comprises:
a spring coupled to said head; and a shaft coupled to said spring.
20 . The electrical connection device of claim 19 , wherein said resilient body further comprises a shell coupled to said head and outwardly concentric to said shaft.
21 . A pin for a socket, comprising:
a head having a central recess; and a shaft in electrical communication with said head and biased from said head, wherein said shaft is configured to extend from said socket.
22 . The pin in claim 21 , further comprising a spring coupled to and interposed between said head and said shaft.
23 . The pin in claim 22 , wherein said spring defines a plurality of coil circumferences.
24 . The pin in claim 23 , wherein said spring comprises:
a first section next to said head and defining a first coil circumference; a second section next to said first section and defining a second coil circumference; and a third section between said second section and said shaft and defining a third coil circumference generally equal to said first coil circumference.
25 . The pin in claim 24 wherein said second coil circumference is greater than said first coil circumference.
26 . The pin in claim 25 , wherein said second section of said spring is configured to contact a nonconductive portion of said socket.
27 . A socket connector comprising:
a cup-shaped head; and a resilient tube next to said head and defining at least one aperture in said tube, wherein said tube is configured to at least partially extend into a socket hole.
28 . The socket connector in claim 27 , wherein said tube defines a plurality of apertures at one length along said tube.
29 . The socket connector in claim 27 , wherein said tube defines a first aperture at a first length along said tube; and a second aperture at a second length along said tube.
30 . The socket connector in claim 27 , wherein said tube defines a first aperture on a first side of said tube and a second aperture on a second side of said tube.
31 . The socket connector of claim 30 , wherein said head is integral to said tube.
32 . A contact, comprising:
a metal body sized to partially fit within an IC chip socket, wherein said metal body defines:
a generally continuous profile; and
at least one deformation of said profile.
33 . The contact in claim 32 , wherein said generally continuous profile comprises a cylindrical profile; and wherein said deformation comprises a rectangular slit.
34 . The contact in claim 32 , wherein said deformation comprises a semi-circular aperture.
35 . A method of processing an array of contacts, comprising:
defining a general shape for each contact of a plurality of contacts, such that said contacts are structurally interconnected; reinforcing the positioning of said each contact relative to other contacts in said plurality after said defining a general shape for each contact of said plurality of contacts; singulating said plurality of contacts after said maintaining a position of said each contact relative to other contacts in said plurality; and attaching said plurality of contacts to a substrate after said singulating said plurality of contacts.
36 . A method of forming a socket, comprising:
providing a semiconductor substrate; defining an arrangement of a plurality of socket contacts from said substrate; preserving said arrangement; providing a substrate having a plurality of conductive leads; and attaching said plurality of socket contacts to said substrate, wherein at least one socket contact is over at least one conductive lead.
37 . The method in claim 36 , wherein said step of attaching said plurality of socket contacts to said substrate comprises attaching said plurality of socket contacts to said substrate with a conductive elastomer.
38 . The method in claim 37 , wherein said step of attaching said plurality of socket contacts to said substrate with a conductive elastomer comprises:
placing said elastomer onto said substrate; and placing said plurality of socket contacts onto said elastomer.
39 . The method in claim 37 , wherein said step of attaching said plurality of socket contacts to said substrate with a conductive elastomer comprises:
placing said elastomer onto an underside of said plurality of socket contacts; and placing said substrate onto an underside of said elastomer.
40 . The method in claim 39 , wherein said step of preserving said arrangement comprises preserving said arrangement with said elastomer.
41 . A method of supporting electrical communication through a socket between an IC chip and a printed circuit board, comprising:
interposing a semiconductive shaft between said IC chip and said printed circuit board; connecting said shaft to said printed circuit board with an adhesive material; and allowing electrical conductivity through said adhesive material in response to a compression between said shaft and said printed circuit board.Cited by (0)
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