US2007037487A1PendingUtilityA1
Polishing pad having a sealed pressure relief channel
Est. expiryAug 10, 2025(expired)· nominal 20-yr term from priority
B24B 37/205
38
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
The present invention provides a chemical mechanical polishing pad comprising a window formed in the polishing pad, the window having a void provided on a side thereof. The invention further provides a pressure relief channel provided in the polishing pad from the void to a periphery of the polishing pad. In addition, a membrane is provided in the channel to prevent contamination of the void.
Claims
exact text as granted — not AI-modified1 . A chemical mechanical polishing pad comprising:
a window formed in the polishing pad, the window having a void provided on a side thereof; a pressure relief channel provided in the polishing pad from the void to a periphery of the polishing pad; and a membrane provided in the channel to prevent contamination of the void.
2 . The polishing pad of claim 1 wherein the membrane is selected from the group comprising polyester, polyethylene, polypropylene, fluoropolymers, polyurethane foamed films, silicone, nylon, silk, woven materials and polyethylene terephthalate.
3 . The polishing pad of claim 2 wherein the membrane is polytetrafluoroethylene.
4 . The polishing pad of claim 3 wherein the membrane is expanded polytetrafluoroethylene.
5 . The polishing pad of claim 1 wherein the pressure relief channel has a width between 0.70 mm to 6.50 mm.
6 . The polishing pad of claim 5 wherein the width varies between the void to the periphery of the polishing pad.
7 . The polishing pad of claim 1 wherein the pressure relief channel has a depth between 0.38 mm to 1.53 mm.
8 . A chemical mechanical polishing pad comprising:
a polishing layer having a window formed therein, the window being exposed to a void on a side thereof; a pressure relief channel provided in the polishing layer from a portion of the void-exposed side of the window to a periphery of the polishing layer; and a membrane provided in the channel to prevent contamination of the void.
9 . A chemical mechanical polishing pad comprising:
a polishing layer overlying a bottom layer, and an adhesive layer disposed between the polishing layer and the bottom layer; a window formed in the polishing layer, the window being exposed to a void on a side thereof; a pressure relief channel provided in the adhesive layer from the void to a periphery of the adhesive layer; and a membrane provided in the channel to prevent contamination of the void.
10 . A chemical mechanical polishing pad comprising:
a polishing layer overlying a bottom layer, and an adhesive layer disposed between the polishing layer and the bottom layer; a window formed in the polishing layer, the window being exposed to a void on a side thereof; a pressure relief channel provided in the bottom layer from the void to a periphery of the bottom layer; and a membrane provided in the channel to prevent contamination of the void.Join the waitlist — get patent alerts
Track US2007037487A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.