Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection

Abstract

In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.

1 . A test control device adapted to: 
 couple to an electronic device that is adapted to be partitioned into segments by using clock gating or signal gating; and    control the electronic device to identify one of the segments that is a source of a failure by selectively disabling at least one of the segments.    
   
   
       2 . A computer system chip comprising: 
 a test control device adapted to: 
 couple to an electronic device to be tested;  
 partition the electronic device into a plurality of segments by using clock gating or signal gating; and  
 control the electronic device to identify one of the plurality of segments that is a source of a failure by selectively disabling at least one of the plurality of segments.  
   
   
   
       3 . The computer system chip of  claim 2  wherein the test control device is adapted to partition the electronic device into the plurality of segments by using clock gating.  
   
   
       4 . The computer system chip of  claim 2  wherein the test control device is adapted to partition the electronic device into the plurality of segments by using signal gating.  
   
   
       5 . A testing arrangement comprising: 
 a test control device adapted to: 
 couple to an electronic device that is adapted to be partitioned into segments by using clock gating or signal gating; and  
 control the electronic device to identify one of the segments that is a source of a failure by selectively disabling at least one of the segments; and  
   a computer adapted to employ the test control device to: 
 partition the electronic device into segments by using clock gating or signal gating; and  
 identify one of the segments that is a source of a failure by selectively disabling at least one of the segments.