Manufacture method of multilevel phase-change memory and operating method thereof
Abstract
A manufacture method of a multilevel phase-change memory and operating method thereof are provided. The method includes providing a substrate, forming a bottom electrode on the substrate, forming a first heating layer on top of the bottom electrode, forming a second heating layer on top of the first heating layer, forming a first phase-change layer and a second phase-change layer respectively on the first heating layer and the second heating layer, and forming a first top electrode and a second electrode respectively on the first phase-change layer and the second phase-change layer. Hence, the bottom electrode, the first heating layer and the first phase-change layer constitute an electrical current path, the bottom electrode, the first heating layer, the second heating layer and the second phase-change layer constitute another electrical current path, and the resistances of the two electrical current path are different, thereby increasing the memory density.
Claims
exact text as granted — not AI-modified1 . A method of manufacturing a multilevel phase-change memory, comprising:
providing a substrate; forming a bottom electrode on the substrate; forming a first heating layer on top of the bottom electrode; forming a second heating layer on top of the first heating layer; forming a first phase-change layer and a second phase-change layer respectively on the first heating layer and the second heating layer; and forming a first top electrode and a second electrode respectively on the first phase-change layer and the second phase-change layer.
2 . The method of claim 1 , wherein the step of forming the second heating layer comprises:
depositing an insulation layer on top of the first heating layer; etching a guiding hole on the insulation layer at a position where the bottom electrode is located; depositing a second heating layer in the guiding hole and on top of the insulation layer; and etching the second heating layer to remove the second heating layer on the insulation layer.
3 . The method of claim 1 , wherein the step of forming the second heating layer comprises:
depositing the second beating layer on the first heating layer corresponding to the bottom electrode; depositing an insulation layer on top of the first heating layer and the second heating layer; and etching the insulation layer above the second heating layer.
4 . The method of claim 1 , wherein the step of forming the first phase-change layer and the second phase-change layer comprises:
forming a phase-change layer on the second heating layer, and etching the phase-change layer to form the first phase-change layer and the second phase-change layer.
5 . The method of claim 1 , wherein the step of forming the first top electrode and the second top electrode comprises:
depositing an insulation layer on top of the first phase-change layer and the second phase-change layer; forming guiding holes by etching the insulation layer at positions where the first phase-change layer and the second phase-change layer are located; and forming the first top electrode and the second top electrode in the guiding holes.
6 . The method of claim 1 , wherein the phase-change ratios of the first phase-change layer and the second phase-change layer are different, and the resistance of the first heating layer and the second heating layer are different.
7 . The method of claim 6 , wherein the material of the first phase-change layer and the second phase-change layer is Ge 2 Sb 2 Te 5 , the material of the first heating layer is TiN and the material of the second heating layer is SiC.
8 . The method of claim 1 , wherein the bottom electrode, the first heating layer and the first phase-change layer constitute an electrical current path, the bottom electrode, the first heating layer, the second heating layer and the second phase-change layer constitute another electrical current path, and the resistances of the two electrical current path are different.
9 . A method of operating a multilevel phase-change memory, wherein the phase-change memory comprises a first phase-change layer, a second phase-change layer, a first heating layer formed on a first surface of the first phase-change layer, a second heating layer formed between the first heating layer and the second phase-change layer, a first top electrode formed on a second surface of the first phase-change layer, a second top electrode formed on the second surface of the second phase-change layer opposite to the second heating layer, and a bottom electrode formed on the second surface of the first heating layer opposite of the second heating layer, the method comprising:
grounding the first top electrode and the second top electrode; and applying a pulse current to the bottom electrode to make the first phase-change layer and the second phase-change layer to change states thereof according to the pulse current.
10 . The method of claim 9 , further comprising, before applying the pulse current, converting the first phase-change layer and the second phase-change layer into a non-crystal state.
11 . A method of operating a multilevel phase-change memory, wherein the phase-change memory comprises a first phase-change layer, a second phase-change layer, a first heating layer formed on a first surface of the first phase-change layer, a second heating layer formed between the first heating layer and the second phase-change layer, a first top electrode formed on a second surface of the first phase-change layer, a second top electrode formed on the second surface of the second phase-change layer opposite to the second heating layer, and a bottom electrode formed on the second surface of the first heating layer opposite of the second heating layer, the method comprising:
grounding the first top electrode and the second top electrode; and applying a pulse current to one of the first top electrode and the second top electrode.Join the waitlist — get patent alerts
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