Method and apparatus for identifying broken pins in a test socket

Abstract

A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.

1 . A method, comprising:
 scanning a test socket after removal of a device under test to generate scan data;   comparing the scan data to reference data; and   identifying a presence of at least a portion of a pin in the test socket based on the comparison.   
     
     
         2 . The method of  claim 1 , wherein scanning the test socket further comprises optically scanning the test socket, and the reference data comprises an optical threshold. 
     
     
         3 . The method of  claim 2 , wherein the optical threshold comprises an intensity threshold. 
     
     
         4 . The method of  claim 1 , wherein scanning the test socket further comprises capturing an image of the test socket, and the reference data comprises a reference image. 
     
     
         5 . The method of  claim 1 , wherein scanning the test socket further comprises electrically scanning the test socket, and the reference data comprises an electrical threshold. 
     
     
         6 . The method of  claim 5 , wherein the electrical threshold comprises at least one of a continuity threshold and a signal response threshold. 
     
     
         7 . The method of  claim 1 , wherein scanning the test socket further comprises scanning the test socket between insertions of devices under test in the test socket. 
     
     
         8 . The method of  claim 1 , further comprising removing the test socket from service responsive to identifying the presence of the pin. 
     
     
         9 . The method of  claim 1 , further comprising automatically sending an alert message responsive to identifying the presence of the pin. 
     
     
         10 . A test system, comprising:
 a test socket operable to receive devices under test;   a scanner operable to scan a test socket after removal of a device under test to generate scan data; and   a control unit operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.   
     
     
         11 . The system of  claim 10 , wherein the scanner comprises an optical scanner, and the reference data comprises an optical threshold. 
     
     
         12 . The system of  claim 11 , wherein the optical threshold comprises an intensity threshold. 
     
     
         13 . The system of  claim 10 , wherein the scanner is operable to capture an image of the test socket as the scan data, and the reference data comprises a reference image of the test socket. 
     
     
         14 . The system of  claim 10 , wherein the scanner is operable to electrically scan the test socket, and the reference data comprises an electrical threshold. 
     
     
         15 . The system of  claim 14 , wherein the electrical threshold comprises at least one of a continuity threshold and a signal response threshold. 
     
     
         16 . The system of  claim 14 , wherein the test socket comprises:
 openings for receiving pins of a device under test;   at least a first contact disposed in the opening; and   at least a second contact disposed in the opening.   
     
     
         17 . The system of  claim 16 , wherein the scanner is operable to determine if continuity exists between the first and second contacts, and the scan data comprises continuity results for each of the openings. 
     
     
         18 . The system of  claim 16 , wherein the scanner is operable to inject a signal on the first contact and measure a response on the second contact, and the scan data comprises response results for each of the openings. 
     
     
         19 . The system of  claim 10 , wherein the scanner is operable to scan the test socket between insertions of devices under test in the test socket. 
     
     
         20 . The system of  claim 10 , wherein the control unit is further operable to remove the test socket from service responsive to identifying the presence of the pin. 
     
     
         21 . The system of  claim 10 , wherein the control unit is further operable to send an alert message responsive to identifying the presence of the pin. 
     
     
         22 . A system, comprising:
 means for scanning a test socket after removal of a device under test to generate scan data;   means for comparing the scan data to reference data; and   means for identifying a presence of at least a portion of a pin in the test socket based on the comparison.