Inventor · disambiguated record
Matthew S. Ryskoski
Also filed as: RYSKOSKI MATTHEW · RYSKOSKI MATTHEW S
14 granted patents·1 pending application·168 citations·filing 2001–2010
92Inventor score
Top patents by PatentIndex Score
15 records- 0188US6721616B1Method and apparatus for determining control actions based on tool health and metrology dataADVANCED MICRO DEVICES INC·Filed 2002·Granted Apr 13, 2004·45 cites·50 claims
- 0282US7197370B1Method and apparatus for dynamic adjustment of an active sensor listADVANCED MICRO DEVICES INC·Filed 2004·Granted Mar 27, 2007·31 cites·30 claims
- 0381US7277824B1Method and apparatus for classifying faults based on wafer state data and sensor tool trace dataADVANCED MICRO DEVICES INC·Filed 2005·Granted Oct 2, 2007·11 cites·7 claims
- 0477US6799311B1Batch/lot organization based on quality characteristicsADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 28, 2004·21 cites·34 claims
- 0575US8040140B2Method and apparatus for identifying broken pins in a test socketGLOBALFOUNDRIES INC·Filed 2010·Granted Oct 18, 2011·3 cites·12 claims
- 0672US6978187B1Method and apparatus for scheduling production lots based on lot and tool health metricsADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 20, 2005·17 cites·41 claims
- 0766US6868353B1Method and apparatus for determining wafer quality profilesADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 15, 2005·10 cites·31 claims
- 0865US6371135B1Method and apparatus for removing a particle from a surface of a semiconductor waferADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 16, 2002·10 cites·20 claims
- 0956US6617258B1Method of forming a gate insulation layer for a semiconductor device by controlling the duration of an etch process, and system for accomplishing sameADVANCED MICRO DEVICES INC·Filed 2001·Granted Sep 9, 2003·5 cites·20 claims
- 1056US6593227B1Method and apparatus for planarizing surfaces of semiconductor device conductive layersADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 15, 2003·7 cites·64 claims
- 1153US6582975B1Method of controlling the deposition of inter-level dielectric layers based upon electrical performance tests, and system for accomplishing sameADVANCED MICRO DEVICES INC·Filed 2001·Granted Jun 24, 2003·4 cites·96 claims
- 1250US7217578B1Advanced process control of thermal oxidation processes, and systems for accomplishing sameADVANCED MICRO DEVICES INC·Filed 2004·Granted May 15, 2007·4 cites·13 claims
- 1342US7695986B1Method and apparatus for modifying process selectivities based on process state informationGLOBALFOUNDRIES INC·Filed 2005·Granted Apr 13, 2010·0 cites·14 claims
- 1440US7282374B1Method and apparatus for comparing device and non-device structuresADVANCED MICRO DEVICES INC·Filed 2004·Granted Oct 16, 2007·0 cites·23 claims
- 1540US2008258704A1Method and apparatus for identifying broken pins in a test socketRYSKOSKI MATTHEW S·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →