US2009101070A1PendingUtilityA1
Member for a Plasma Processing Apparatus and Method of Manufacturing the Same
Est. expiryMar 27, 2026(expired)· nominal 20-yr term from priority
C23C 4/10C23C 18/1254C04B 41/5031C23C 18/1208C04B 41/5045C04B 41/009C03C 2217/228C23C 28/042C04B 41/87C23C 18/1279C03C 2218/113C03C 17/25
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Claims
Abstract
A member for a plasma processing apparatus, which is excellent in film-formability, durability, and reliability, is provided. On a substrate, a ceramic film having a purity not less than 98% is provided. In the ceramic film, grains constituting the film have a grain diameter not greater than 50 nm and the amount of moisture released from the film is not more than 10 19 molecules/cm 2 .
Claims
exact text as granted — not AI-modified1 . A member for a plasma processing apparatus, the member comprising a substrate and a ceramic film formed thereon and having a purity not less than 98%, wherein:
the ceramic film is constituted by grains having a grain diameter not greater than 50 nm, the amount of moisture released from the film being not more than 10 19 molecules/cm 2 .
2 . The member for a plasma processing apparatus as claimed in claim 1 , the member comprising, as the ceramic film, a sol-gel film formed by a sol-gel method.
3 . The member for a plasma processing apparatus as claimed in claim 1 , wherein:
the substrate is made of metal, ceramics, glass, or a composite material thereof; the ceramic film being a film comprising at least one kind of element selected from group II-VI elements, group XII-XIV elements, and rare-earth elements in the periodic table.
4 . The member for a plasma processing apparatus as claimed in claim 1 , wherein the ceramic film is a film comprising at least one kind of element selected from Mg, Al, Si, Ti, Cr, Zn, Y, Zr, W, and the rare-earth elements.
5 . The member for a plasma processing apparatus as claimed in claim 1 , wherein the ceramic film has translucency represented by a transmittance not less than 80% in a visible light range at a wavelength between 400 and 800 nm when a film thickness is not greater than 5 μm.
6 . The member for a plasma processing apparatus as claimed in claim 1 , wherein the ceramic film is formed in an oxygen-containing atmosphere in a temperature range between 250 and 1200° C.
7 . The member for a plasma processing apparatus as claimed in claim 1 , wherein the ceramic film has a purity not less than 99.5%.
8 . The member for a plasma processing apparatus as claimed in claim 1 , wherein:
the substrate is made of metal; the substrate being provided with a film formed on its surface and obtained by passivation of the surface of the substrate.
9 . The member for a plasma processing apparatus as claimed in claim 1 , wherein:
the substrate is made of aluminum; the substrate being provided with an anodic oxidation film formed on its surface.
10 . The member for a plasma processing apparatus as claimed in claim 1 , wherein:
the substrate is made of metal; the substrate being provided with a film formed on its surface by heat treatment.
11 . The member for a plasma processing apparatus as claimed in claim 1 , the member comprising, as the ceramic film, a sprayed film formed on the substrate by a spraying method and a sol-gel film formed on the sprayed film by a sol-gel method.
12 . The member for a plasma processing apparatus as claimed in claim 1 , the member comprising, as the ceramic film, a sol-gel film formed on the substrate by a sol-gel method and a sprayed film formed on the sol-gel film by a spraying method.
13 . The member for a plasma processing apparatus as claimed in claim 1 , wherein the substrate has a plate-like shape having pores, a tubular shape, or a container shape.
14 . A method of manufacturing a member for a plasma processing apparatus, comprising the step of forming a ceramic film having a purity not less than 98% on a substrate, wherein:
the forming of the ceramic film is carried out so that grains constituting the film have a grain diameter not greater than 50 nm and the amount of moisture released from the film is not more than 10 19 molecules/cm 2 .
15 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , wherein, as the ceramic film, a sol-gel film is formed by a sol-gel method.
16 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising the steps of:
forming the substrate made of metal, ceramics, glass, or a composite material thereof; and forming, as the ceramic film, a film comprising at least one kind of element selected from group II-VI elements, group XII-XIV elements, and rare-earth elements in the periodic table.
17 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising the step of forming, as the ceramic film, a film comprising at least one kind of element selected from Mg, Al, Si, Ti, Cr, Zn, Y, Zr, W, and rare-earth elements.
18 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , wherein the ceramic film is formed in an oxygen-containing atmosphere in a temperature range between 250 and 1200° C.
19 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , wherein the ceramic film has a purity not less than 99.5%.
20 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising the steps of:
forming the substrate made of metal; and forming, on a surface of the substrate, a film obtained by passivation of the surface of the substrate.
21 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising the steps of:
forming the substrate made of aluminum; and forming an anodic oxidation film on a surface of the substrate.
22 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising the steps of:
forming the substrate made of metal; and forming a film formed by a heat treatment on a surface of the substrate.
23 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising, as the forming of the ceramic film, the steps of forming a sprayed film on the substrate by a spraying method and forming a sol-gel film on the sprayed film by a sol-gel method.
24 . The method of manufacturing a member for a plasma processing apparatus as claimed in claim 14 , comprising, as the forming of the ceramic film, the steps of forming a sol-gel film on the substrate by a sol-gel method and forming a sprayed film on the sol-gel film by a spraying method.Join the waitlist — get patent alerts
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