Probe and probe card for integrated circuit devices using the same

Abstract

A vertical probe comprises a linear body, a tip portion connected to one side of the linear body, and at least one slot positioned on the linear body. In particular, the vertical probe includes a depressed structure having a plurality of slots positioned on the linear body in parallel and on one side of the linear body. The present application also provides a probe card for integrated circuit devices comprising an upper guiding plate having a plurality of fastening holes, a bottom guiding plate having a plurality of guiding holes and a plurality of vertical probes positioned in the guiding holes. The vertical probe includes a linear body positioned in the guiding holes, a tip portion connected to one side of the linear body and at least one slot positioned on the linear body.

1 . A vertical probe, comprising:
 a linear body;   a tip portion connected to one side of the linear body; and   at least one slot positioned on the linear body.   
     
     
         2 . The vertical probe of  claim 1 , wherein the slot is perpendicular to the surface of the linear body. 
     
     
         3 . The vertical probe of  claim 1 , comprising a plurality of slots. 
     
     
         4 . The vertical probe of  claim 3 , wherein the slots are positioned on the linear body in parallel. 
     
     
         5 . The vertical probe of  claim 3 , wherein the slots are positioned on one side of the linear body. 
     
     
         6 . The vertical probe of  claim 1 , wherein the linear body is cylindrical. 
     
     
         7 . The vertical probe of  claim 6 , wherein the slot is pie-shaped. 
     
     
         8 . The vertical probe of  claim 7 , wherein an included angle between the two edges of the pie-shaped slot is between 90 and 180 degrees. 
     
     
         9 . The vertical probe of  claim 1 , wherein the slot includes an open portion and a depressed portion connected to the open portion. 
     
     
         10 . The vertical probe of  claim 9 , wherein the open portion and the depressed portion connect at an interface having a smaller width than the open portion and the depressed portion. 
     
     
         11 . A probe card for integrated circuit devices, comprising:
 an upper guiding plate having a plurality of fastening holes;   a bottom guiding plate having a plurality of guiding holes; and   a plurality of vertical probes including:   a linear body positioned in the guiding holes;   a tip portion connected to one side of the linear body; and   at least one slot positioned on the linear body.   
     
     
         12 . The probe card for integrated circuit devices of  claim 11 , wherein the slot is perpendicular to the surface of the linear body. 
     
     
         13 . The probe card for integrated circuit devices of  claim 11 , comprising a plurality of slots. 
     
     
         14 . The probe card for integrated circuit devices of  claim 13 , wherein the slots are positioned on the linear body in parallel. 
     
     
         15 . The probe card for integrated circuit devices of  claim 13 , wherein the slots are positioned on one side of the linear body. 
     
     
         16 . The probe card for integrated circuit devices of  claim 11 , wherein the linear body is cylindrical. 
     
     
         17 . The probe card for integrated circuit devices of  claim 16 , wherein the slot pie-shaped. 
     
     
         18 . The probe card for integrated circuit devices of  claim 17 , wherein an included angle between the two edges of the pie-shaped slot is between 90 and 180 degrees. 
     
     
         19 . The probe card for integrated circuit devices of  claim 11 , wherein the slot includes an open portion and a depressed portion connected to the open portion. 
     
     
         20 . The probe card for integrated circuit devices of  claim 19 , wherein the open portion and the depressed portion connect at an interface having a smaller width than the open portion and the depressed portion. 
     
     
         21 . The probe card for integrated circuit devices of  claim 11 , wherein the slot of the vertical probes face the same direction. 
     
     
         22 . The probe card for integrated circuit devices of  claim 11 , wherein the guiding holes are positioned below the fastening holes. 
     
     
         23 . The probe card for integrated circuit devices of  claim 11 , wherein the upper guiding plate is a circuit board.