Inventor · disambiguated record
Choon Leong Lou
Also filed as: LOU CHOON LEONG
52 granted patents·33 pending applications·169 citations·filing 2002–2024
97Inventor score
Files withSTAR TECHN INC22TECAT TECH SUZHOU LIMITED22STAR TECH INC19LOU CHOON LEONG13STAR TECH WUHAN CO LTD3
Top patents by PatentIndex Score
85 records- 0193US6906543B2Probe card for electrical testing a chip in a wide temperature rangeSTAR TECHN INC·Filed 2003·Granted Jun 14, 2005·87 cites·20 claims
- 0289US7576553B2Integrated circuit probing apparatus having a temperature-adjusting mechanismSTAR TECHN INC·Filed 2006·Granted Aug 18, 2009·12 cites·8 claims
- 0387US11293975B2Probing deviceTECAT TECH SUZHOU LIMITED·Filed 2020·Granted Apr 5, 2022·2 cites·16 claims
- 0486US11761984B2Probe card device and testing equipment thereofTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Sep 19, 2023·1 cites·21 claims
- 0586US7253646B2Probe card with tunable stage and at least one replaceable probeSTAR TECHN INC·Filed 2005·Granted Aug 7, 2007·15 cites·6 claims
- 0685US11307246B2Probing apparatus and method of operating the sameSTAR TECH INC·Filed 2019·Granted Apr 19, 2022·3 cites·19 claims
- 0783US7436171B2Apparatus for probing multiple integrated circuit devicesSTAR TECHN INC·Filed 2007·Granted Oct 14, 2008·12 cites·9 claims
- 0881US7928749B2Vertical probe comprising slots and probe card for integrated circuit devices using the sameSTAR TECHN INC·Filed 2010·Granted Apr 19, 2011·4 cites·17 claims
- 0978US11209462B1Testing apparatusSTAR TECH INC·Filed 2020·Granted Dec 28, 2021·1 cites·14 claims
- 1077US7616018B2Integrated circuit probing apparatus having a temperature-adjusting mechanismSTAR TECHN INC·Filed 2008·Granted Nov 10, 2009·4 cites·4 claims
- 1175US8035405B2Semiconductor devices testing apparatus with temperature-adjusting designSTAR TECHN INC·Filed 2009·Granted Oct 11, 2011·7 cites·22 claims
- 1274US9329205B2High-precision semiconductor device probing apparatus and system thereofLOU CHOON LEONG·Filed 2012·Granted May 3, 2016·4 cites·18 claims
- 1374US8169227B2Probing apparatus with multiaxial stages for testing semiconductor devicesLOU CHOON LEONG·Filed 2009·Granted May 1, 2012·7 cites·19 claims
- 1473US11054465B2Method of operating a probing apparatusSTAR TECH INC·Filed 2019·Granted Jul 6, 2021·1 cites·15 claims
- 1572US12498397B2Probe card and thermal conduction device thereofSTAR TECH INC·Filed 2023·Granted Dec 16, 2025·0 cites·14 claims
- 1669US7295023B2Probe cardSTAR TECHN INC·Filed 2006·Granted Nov 13, 2007·5 cites·5 claims
- 1767US11768223B2Testing device and probe elements thereofTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Sep 26, 2023·0 cites·14 claims
- 1867US8692570B2Probe card for testing high-frequency signalsLOU CHOON LEONG·Filed 2011·Granted Apr 8, 2014·2 cites·9 claims
- 1966US12467951B2Probe deviceTECAT TECH SUZHOU LIMITED·Filed 2023·Granted Nov 11, 2025·0 cites·9 claims
- 2066US11828789B2Test apparatus and jumper thereofSTAR TECH INC·Filed 2022·Granted Nov 28, 2023·0 cites·17 claims
- 2166US11549968B2Probing systemTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 2264US11262400B2Shielding for probing systemTECAT TECH SUZHOU LIMITED·Filed 2020·Granted Mar 1, 2022·0 cites·19 claims
- 2362US11567104B2High speed signal transmitting and receiving detection deviceTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Jan 31, 2023·0 cites·10 claims
- 2460US12504443B2Probe card structure including probe sets with different lengthsTECAT TECH SUZHOU LIMITED·Filed 2023·Granted Dec 23, 2025·0 cites·9 claims
- 2560US11953518B2Switching matrix system and operating method thereof for semiconductor characteristic measurementSTAR TECH INC·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
- 2660US11047880B2Probing deviceSTAR TECH INC·Filed 2019·Granted Jun 29, 2021·0 cites·19 claims
- 2759US12467954B2Probe card deviceTECAT TECH SUZHOU LIMITED·Filed 2023·Granted Nov 11, 2025·0 cites·13 claims
- 2858US12345759B2Guide plate structure having guide plates with through holes and probe array having guide plate structureXINGR HOLDINGS PTE LTD·Filed 2022·Granted Jul 1, 2025·0 cites·6 claims
- 2958US12163980B2Probe and elastic structure thereofTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Dec 10, 2024·0 cites·15 claims
- 3058US12111505B2Light guiding device and light guiding device applied to silicon photonics structureSTAR TECH WUHAN CO LTD·Filed 2022·Granted Oct 8, 2024·0 cites·5 claims
- 3158US2025052785A1Probe card structureSTAR TECH INC·Filed 2023·Application pending·0 cites
- 3258US2024410918A1Probe card structure for high frequency test and testing method thereofSTAR TECH INC·Filed 2023·Application pending·0 cites
- 3357US12255113B2Alignment method and alignment deviceSTAR TECH WUHAN CO LTD·Filed 2023·Granted Mar 18, 2025·0 cites·7 claims
- 3457US12210037B2Probe array and probe structureVUETTE PTE LTD·Filed 2023·Granted Jan 28, 2025·0 cites·14 claims
- 3557US11879913B2Probe card structureTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Jan 23, 2024·0 cites·8 claims
- 3657US7791363B2Low temperature probing apparatusSTAR TECHN INC·Filed 2009·Granted Sep 7, 2010·2 cites·25 claims
- 3757US2024430005A1Optical signal processing device and optical signal measurement methodTECAT TECH SUZHOU LIMITED·Filed 2023·Application pending·0 cites
- 3857US2025004013A1Probe card structureTECAT TECH SUZHOU LIMITED·Filed 2023·Application pending·0 cites
- 3956US11804417B2Semiconductor structure comprising heat dissipation memberTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Oct 31, 2023·0 cites·10 claims
- 4056US2009015283A1Integrated circuit probing apparatus having a temperature-adjusting mechanismSTAR TECHN INC·Filed 2008·Application pending·0 cites
- 4154US11217649B2Method of testing and analyzing display panelSTAR TECH INC·Filed 2020·Granted Jan 4, 2022·0 cites·18 claims
- 4253US12117484B2Test deviceTECAT TECH SUZHOU LIMITED·Filed 2022·Granted Oct 15, 2024·0 cites·17 claims
- 4351US11965912B2Probe card device having a probe structure with a protrusion portionTECAT TECH SUZHOU LIMITED·Filed 2021·Granted Apr 23, 2024·0 cites·7 claims
- 4451US2023314475A1Probe structureLOU CHOON LEONG·Filed 2022·Application pending·0 cites
- 4551US2025283910A1Socket assemblyXINGR TECH ZHEJIANG LIMITED·Filed 2024·Application pending·0 cites
- 4650US2023400480A1Probe device, probe system including the probe device and operating method thereofSTAR TECH INC·Filed 2023·Application pending·0 cites
- 4750US2022397587A1Elastic probe element, elastic probe assembly, and testing deviceTECAT TECH SUZHOU LIMITED·Filed 2022·Application pending·0 cites
- 4850US2025130253A1Management system for probe cardsSTAR TECH INC·Filed 2023·Application pending·0 cites
- 4949US10890614B2Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under testSTAR TECH INC·Filed 2019·Granted Jan 12, 2021·0 cites·17 claims
- 5049US9535114B2Testing deviceSTAR TECH INC·Filed 2013·Granted Jan 3, 2017·0 cites·19 claims
Showing the top 50 of 85 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →