Integrated circuit probing apparatus having a temperature-adjusting mechanism

Abstract

A probing apparatus for integrated circuit devices comprises a probe card, a probe holder for holding the probe card, a test head and a temperature-adjusting mechanism. The probe card comprises at least one probe capable of forming an electrical connection with the integrated circuit device facing a first surface of the probe card, and the temperature-adjusting mechanism can be positioned on/above a second surface of the probe card. The temperature-adjusting mechanism can be positioned inside the probe card, inside the probe holder or on the probe holder. The test head comprises a plurality of pins configured to form electrical connections with connecting sites of the probe card and test and measurement units and apparatus. The temperature-adjusting mechanism can be positioned on or inside the test head. The temperature-adjusting mechanism comprises a flow line having at least one inlet and a plurality of outlets, and the outlets can be positioned on the second surface of the probe card.

1 . An integrated circuit probing apparatus, comprising:
 a circuit board having a first surface and a second surface;   at least one probe positioned on the circuit board, the probe being configured to electrically contact an integrated circuit device facing the first surface;   a holder configured to receive the circuit board therein, wherein the holder is substantially L-shaped in cross-section to hold the first surface of the circuit board and does not cover the second surface of the circuit board; and   a temperature-adjusting mechanism positioned in the holder or on the holder.   
   
   
       2 . The integrated circuit probing apparatus of  claim 1 , wherein the temperature-adjusting mechanism is a flow line positioned in the holder. 
   
   
       3 . The integrated circuit probing apparatus of  claim 2 , wherein the flow line permits a fluid to flow therein, and the fluid is gas, liquid or the combination thereof. 
   
   
       4 . The integrated circuit probing apparatus of  claim 2 , wherein the flow line includes at least one fluid inlet and a plurality of fluid outlets. 
   
   
       5 . The integrated circuit probing apparatus of  claim 2 , wherein the temperature-adjusting mechanism is a guiding tube positioned on the holder, and the guiding tube includes at least one fluid inlet and a plurality of fluid outlets. 
   
   
       6 . The integrated circuit probing apparatus of  claim 1 , further comprising a test head including a plurality of test measurement units configured to form electrical connections with a plurality of connecting sites on the second surface of the circuit board. 
   
   
       7 . The integrated circuit probing apparatus of  claim 1 , wherein the temperature-adjusting mechanism includes fluid outlets facing the test measurement units of the test head and configured to ensure that the test head and the test measurement units are performing the electrical measurements of the integrated circuit device under a specified operation temperature.