US2011011148A1PendingUtilityA1
Method for forming patterned modified metal layer
Est. expiryJul 15, 2029(~3 yrs left)· nominal 20-yr term from priority
B44C 1/20
63
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Claims
Abstract
A method for forming a patterned modified metal layer is disclosed, which comprises the following steps: (A) providing a metal base which is in the form of either a bulk metal or a metal coated substrate, and a mold with patterns; (B) applying the mold onto the metal base to transfer the patterns of the mold to the metal surface; (C) removing the mold; and (D) modifying the whole metal base or the, surface and a certain depth beneath the surface of metal base to form a modified metal layer with designated patterns.
Claims
exact text as granted — not AI-modified1 . A method for forming a patterned modified metal layer, comprising the following steps:
(A) providing a metal base, and a mode with patterns; (B) applying the mold onto the metal base to transfer the patterns of the mold to a surface of the metal base; (C) removing the mold; and (D) modifying the metal base to form a modified metal layer with the patterns.
2 . The method as claimed in claim 1 , wherein the whole metal base, or the surface of the metal base is modified in the step (D).
3 . The method as claimed in claim 1 , wherein the metal base is a with bulk metal, or a substrate with a metal layer formed thereon.
4 . The method as claimed in claim 3 , wherein the material of the bulk metal and the metal layer is soft metals.
5 . The method as claimed in claim 4 , wherein the soft metal is selected from the group consisting of Al, Ti, Zn, Cu, Ag, Ni, Au, and Pt.
6 . The method as claimed in claim 1 , wherein the modified metal layer is a metal oxide layer.
7 . The method as claimed in claim 6 , wherein the metal oxide layer is an Al 2 O 3 layer, a TiO 2 layer, or a ZnO layer.
8 . The method as claimed in claim 1 , wherein the modified metal layer is a metal nitride layer.
9 . The method as claimed in claim 8 , wherein the metal nitride layer is TiN.
10 . The method as claimed in claim 1 , wherein the metal layer is modified under an atmosphere of inert gas in the step (D).
11 . The method as claimed in claim 1 , wherein the metal layer is modified under vacuum in the step (D).
12 . The method as claimed in claim 3 , wherein the substrate is a silicon substrate, a glass substrate, or a quartz substrate.
13 . The method as claimed in claim 1 , wherein the metal base is modified through heat treatment, laser treatment, pulse laser treatment, plasma treatment, or rapid thermal annealing in the step (D).
14 . The method as claimed in claim 13 , wherein the plasma treatment is oxygen-plasma treatment, or nitrogen-plasma treatment.
15 . The method as claimed in claim 1 , wherein the thickness of the modified metal layer is 1 nm˜5 μm.
16 . The method as claimed in claim 4 , wherein the thickness of the metal layer is 1 nm˜5 μm.
17 . The method as claimed in claim 1 , wherein the modified metal layer comprises recesses.
18 . The method as claimed in claim 17 , wherein the depth of the recesses is 1 nm˜3 μm.
19 . The method as claimed in claim 17 , wherein the width of the recesses is 3 nm˜300 μm.
20 . The method as claimed in claim 1 , wherein the surface of the metal base is a flat surface, or a curved surface.Join the waitlist — get patent alerts
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