US2011115080A1PendingUtilityA1

Semiconductor device including semiconductor construct installed on base plate, and manufacturing method of the same

Assignee: CASIO COMPUTER CO LTDPriority: Nov 13, 2009Filed: Nov 11, 2010Published: May 19, 2011
Est. expiryNov 13, 2029(~3.3 yrs left)· nominal 20-yr term from priority
Inventors:Shinji Wakisaka
H10W 70/099H10W 72/073H10W 72/0198H10W 72/874H10W 72/9413H10W 70/09H10W 70/60H10W 90/734H10W 90/736H10W 72/01253H10W 72/231H10W 90/701H10W 74/137H10W 74/117H10W 74/014H10W 72/075H10W 72/30H10W 72/20H10W 70/614H10W 70/20H10P 54/00
48
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

A semiconductor device comprises a semiconductor construct including a semiconductor substrate, and an external connection electrode provided to protrude on the surface of the semiconductor substrate, a base plate on which the semiconductor construct is installed, and a sealing layer stacked on the semiconductor substrate except for the external connection electrode and on the base plate including the side surface of the semiconductor substrate.

Claims

exact text as granted — not AI-modified
1 . A semiconductor device comprising:
 a semiconductor construct including a semiconductor substrate, and an external connection electrode provided to protrude on the surface of the semiconductor substrate;   a base plate on which the semiconductor construct is installed; and   a sealing layer stacked on the semiconductor substrate except for the external connection electrode and on the base plate including the side surface of the semiconductor substrate.   
     
     
         2 . The semiconductor device according to  claim 1 , wherein
 the sealing layer is formed by putting the external connection electrode through a prepreg and curing the prepreg.   
     
     
         3 . The semiconductor device according to  claim 2 , wherein
 the sealing layer is a single layer, and is made of a glass fiber reinforced epoxy resin, a glass fiber reinforced polyimide resin, or an epoxy resin or polyimide resin which is not fiber reinforced.   
     
     
         4 . The semiconductor device according to  claim 1 , wherein
 a connection pad and a wiring line which is provided to be connected to the connection pad are provided on the semiconductor substrate, and the external connection electrode is provided on a land of the wiring line.   
     
     
         5 . The semiconductor device according to  claim 1 , wherein
 the semiconductor substrate is bonded onto the base plate by an adhesive layer.   
     
     
         6 . The semiconductor device according to  claim 1 , wherein
 an upper wiring line is provided on the sealing layer to be directly connected to the external connection electrode without any insulating film in between.   
     
     
         7 . The semiconductor device according to  claim 1 , wherein
 the external connection electrode is a columnar electrode.   
     
     
         8 . A semiconductor device manufacturing method comprising:
 mounting a plurality of semiconductor constructs on a base plate, each of the semiconductor constructs including an external connection electrode provided to protrude on the surface of a semiconductor substrate; and   stacking a sealing layer on the semiconductor substrate except for the external connection electrode and on the base plate including the side surface of the semiconductor substrate.   
     
     
         9 . The semiconductor device manufacturing method according to  claim 8 , wherein
 to stack the sealing layer, a prepreg is laid on the semiconductor substrate and the base plate, the external connection electrode is put through the prepreg, and the prepreg is cured into the sealing layer.   
     
     
         10 . The semiconductor device manufacturing method according to  claim 8 , wherein
 the semiconductor substrate is a chipped semiconductor substrate,   the semiconductor substrates are installed on the base plate before the sealing layer is stacked,   to stack the sealing layer, a prepreg is laid on the base plate and a plurality of semiconductor substrates, the external connection electrode is put through the prepreg, and the prepreg is cured into the sealing layer, and   the base plate and the sealing layer are diced after the sealing layer is stacked.   
     
     
         11 . The semiconductor device manufacturing method according to  claim 9 , wherein
 the prepreg is a single layer, and is made of a glass fiber reinforced epoxy resin, a glass fiber reinforced polyimide resin, or an epoxy resin or polyimide resin which is not fiber reinforced.   
     
     
         12 . The semiconductor device manufacturing method according to  claim 8 , wherein
 a connection pad and a wiring line which is formed to be connected to the connection pad are formed on the semiconductor substrate, and the external connection electrode is provided on a land of the wiring line.   
     
     
         13 . The semiconductor device manufacturing method according to  claim 8 , wherein
 the semiconductor substrate is bonded onto the base plate by an adhesive layer.   
     
     
         14 . The semiconductor device manufacturing method according to  claim 8 , wherein
 an upper wiring line is formed on the sealing layer to be directly connected to the external connection electrode without any insulating film in between.   
     
     
         15 . The semiconductor device manufacturing method according to  claim 8 , wherein
 the external connection electrode is a columnar electrode.

Join the waitlist — get patent alerts

Track US2011115080A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.