Apparatus for stem sample inspection in a charged particle beam instrument
Abstract
An apparatus for in-situ sample examination in a dual-beam FIB includes a cassette for holding probe tips inside the FIB, where the FIB has an X-Y plane and a port for a nano-manipulator probe shaft, and where the probe shaft is further capable of releasably holding a probe tip. The cassette has a base and at least one probe-tip station connected to the base. The probe-tip station has a slot for receiving a probe tip, where the probe-tip slot has an angle with respect to the base substantially equal to the angle of the port for the nano-manipulator probe shaft relative to the X-Y plane of the FIB. The cassette has a clamp with springy fingers located in the slot for receiving and releasably holding the probe tip. The apparatus is adapted to in-situ STEM examination of samples.
Claims
exact text as granted — not AI-modified1 . A cassette for holding probe tips inside a charged particle beam instrument, where the charged particle beam instrument has an X-Y plane and a port for a nano-manipulator probe shaft, where the probe shaft is further capable of releasably holding a probe tip; the cassette comprising:
a base; at least one probe-tip station connected to the base; the probe-tip station having a slot for receiving a probe tip; the probe-tip slot having an angle with respect to the base substantially equal to the angle of the port for the nano-manipulator probe shaft relative to the X-Y plane of the charged particle beam instrument; a clamp;
the clamp partially surrounding the slot;
the clamp having a plurality of springy fingers for receiving and releasably holding the probe tip in the slot.
2 . The cassette of claim 1 comprising a plurality of probe-tip stations.
3 . The cassette of claim 1 , where the probe tip to be received has a collar; the cassette further comprising:
the springy fingers of the clamp being sized to receive and releasably hold the collar of the probe tip in the slot.
4 . The cassette of claim 3 , further comprising:
the collar having a flat portion; at least one springy finger of the clamp configured with a flat corresponding to the flat of the collar.
5 . The cassette of claim 1 , where the slot is defined by a saddle;
where the saddle is attached to the base.
6 . The cassette of claim 1 where each probe tip station comprises a cavity in the base;
the cavity sized to receive the clamp.
7 . The cassette of claim 6 where the clamp is removably held in the cavity by screws.
8 . The cassette of claim 1 , where the slot is defined by a saddle; the cassette further comprising:
the saddle and the clamp being integral with the exception of a gap between the saddle and the springy fingers of the clamp.
9 . A cassette for holding probe tips inside a charged particle beam instrument, where the charged particle beam instrument a port for a nano-manipulator probe shaft, where the probe shaft is further capable of releasably holding a probe tip; the probe tip having a collar; the cassette comprising:
a base; at least one probe-tip station connected to the base; the probe-tip station having a slot for receiving a probe tip; a clamp;
the clamp partially surrounding the slot;
the clamp having a plurality of springy fingers for receiving and releasably holding the collar of the probe tip in the slot;
the probe-tip station having a cavity in the base,
where the cavity is sized to receive and releaseably hold the clamp.
10 . The cassette of claim 9 comprising a plurality of probe-tip stations.
11 . The cassette of claim 9 , further comprising:
the collar having a flat portion; at least one springy finger of the clamp configured with a flat corresponding to the flat of the collar.
12 . The cassette of claim 9 , where the slot is defined by a saddle;
where the saddle is attached to the base.
13 . The cassette of claim 9 where the clamp is removably held in the cavity by screws.Join the waitlist — get patent alerts
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