US2011212628A1PendingUtilityA1
Sequential pulse deposition
Est. expiryFeb 13, 2021(expired)· nominal 20-yr term from priority
Inventors:Weimin Li
H10P 14/40C23C 16/52C23C 16/45523C23C 16/4408C23C 16/45527
50
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
A method for growing films on substrates using sequentially pulsed precursors and reactants, system and devices for performing the method, semiconductor devices so produced, and machine readable media containing the method.
Claims
exact text as granted — not AI-modified1 . A method of forming a film on a substrate, comprising:
flowing a purge gas into a reaction chamber containing the substrate; injecting a pulse of precursor gas into the reaction chamber to initiate depositing a film on the substrate; injecting a pulse of reactant gas into the reaction chamber at a reactant gas pulse time, the reactant gas pulse time being after the pulse of precursor gas has been injected into the reaction chamber and prior to complete purge of the precursor gas; and reacting the precursor gas with the reactant gas adjacent the substrate to deposit a layer of the film on the substrate.
2 . The method of claim 1 , wherein the above process is repeated until the film has a desired thickness, with injection of another pulse of precursor gas into the chamber after the reactant gas pulse time and prior to complete purge of the reactant gas.
3 . The method of claim 1 , wherein reacting the precursor with the reactant forms a layer on the substrate at a rate greater than 100 Å/cycle.Join the waitlist — get patent alerts
Track US2011212628A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.