US2012080056A1PendingUtilityA1
System and method for removing organic residue from a charged particle beam system
Est. expiryAug 8, 2025(expired)· nominal 20-yr term from priority
Inventors:Hong Xiao
H01J 37/28H01J 37/02H01J 2237/006H01J 2237/022H01J 2237/024
52
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Claims
Abstract
A system and method for removing an organic residue from a charged particle beam system includes a conduit that is coupled to the column and is for adding oxygen to the column. A heater is coupled to the column and is for increasing the temperature in the column. A pump is coupled to the column and is for removing a gas from the chamber, wherein the gas is a byproduct of a chemical reaction of the organic residue and the oxygen.
Claims
exact text as granted — not AI-modified1 . A method for removing an organic residue from a charged particle beam system comprising:
increasing the temperature in the chamber; adding oxygen to a chamber in the charged particle beam system; and removing a gas from the chamber, wherein the gas is a byproduct of a chemical reaction of the organic residue and the oxygen.
2 . The method of claim 1 further comprising:
waiting for a period of time for the oxygen to react with the organic residue and form the gas.
3 . The method of claim 2 further comprising:
inserting a heater into the chamber, wherein the temperature in the chamber is increased by the heater.
4 . The method of claim 3 further comprising:
increasing the pressure in the chamber.
5 . The method of claim 4 , increasing the pressure further comprising:
adding nitrogen to the chamber.
6 . The method of claim 4 further comprising:
positioning the heater in close proximity to the organic residue; and
increasing the temperature in an area close to the organic residue.
7 . The method of claim 6 further comprising:
directing the oxygen to the area of increased temperature.
8 . The method of claim 7 , the oxygen being ozone, wherein the ozone dissociates into a molecularly stable oxygen and an oxygen free radical in the area of increased temperature.
9 . The method of claim 4 , removing the gas from the chamber further comprising:
decreasing the pressure in the chamber.
10 . The method of claim 4 , the chamber further including a beam column with a deflector coupled to a lens, a part of the organic residue on each of the deflector and the lens, the method further comprising:
positioning the heater in close proximity to the lens and the deflector; increasing the temperature near the lens and the deflector; and directing the oxygen to the part of the organic residue on each of the deflector and the lens.
11 . The method of claim 10 , the oxygen being ozone, wherein the ozone dissociates into a stable oxygen molecule and an oxygen free radical.Cited by (0)
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