US2012144101A1PendingUtilityA1
Programming memory cells with additional data for increased threshold voltage resolution
Est. expiryOct 30, 2028(~2.3 yrs left)· nominal 20-yr term from priority
G11C 16/26G11C 16/10G11C 7/1006G11C 11/5642G11C 8/10G11C 2211/5641G11C 11/5628
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Claims
Abstract
Methods for programming memory and memory devices are provided. According to at least one such method, additional data is appended to original data and the resulting data is programmed in a selected memory cell. The appended data increases the program threshold voltage margin of the original data. The appended data can be a duplicate of the original data or logical zeros. When the selected memory cell is read, the memory control circuitry can read just the original data in the MSB field or the memory control circuitry can read the entire programmed data and ignore the LSB field, for example.
Claims
exact text as granted — not AI-modified1 . A method for programming memory, the method comprising:
appending additional data to original data to form a new programming word,
wherein the additional data are duplicate data of the original data; and programming the memory with the new programming word.
2 . The method of claim 1 and further comprising memory control circuitry controlling transfer of the original data to the memory for programming.
3 . The method of claim 1 wherein the original data comprises a logical bit.
4 . The method of claim 1 wherein the original data comprise a plurality of logical bits.
5 . The method of claim 2 wherein the original data are MSB data bits and the additional data are LSB data bits.
6 . The method of claim 1 and further comprising transferring one logical bit to the memory and programming further comprises programming three or more logical bits.
7 . The method of claim 1 and further comprising transferring two logical bits to the memory and programming further comprises programming more than two logical bits.
8 . The method of claim 1 wherein programming further comprises:
applying a programming pulse followed by a verify pulse to the memory.
9 . A method for programming a memory device, the method comprising:
transferring at least a portion of original data to memory; appending additional data to the at least the portion of original data to form a new programming word wherein the additional data are duplicate data of the original data; and programming the memory in accordance with the new programming word.
10 . The method of claim 9 wherein transferring the original data comprises memory control circuitry controlling transfer of the at least the portion of original data to the memory array.
11 . The method of claim 9 and further comprising:
transferring a remaining portion of the original data, that has not yet been programmed, to the memory; and
programming the remaining portion of the original data to the memory.
12 . A memory device comprising:
memory control circuitry configured to control operation of the memory device, the memory control circuitry configured to transfer original data; and a memory array coupled to the memory control circuitry and configured to receive the original data, the memory array further configured to append additional data to the original data to form a new word, wherein the additional data are duplicate data of the original data, the memory array further configured to be programmed with the new word.
13 . The memory device of claim 12 wherein the additional data are place holder bits.
14 . The memory device of claim 12 wherein each memory cell of the memory array is configured to be programmed as a multilevel cell.
15 . The memory device of claim 12 wherein the memory control circuitry is configured to ignore the appended additional data during a read operation.
16 . The memory device of claim 12 and further comprising a digital-to-analog converter configured to convert digital bit patterns to threshold voltages to be programmed to the memory array.
17 . The memory device of claim 12 wherein the memory array is configured to output a signal corresponding to one of four digital bit reference fixed bit patterns for each memory cell that is read.
18 . The memory device of claim 12 wherein each memory cell of the memory array is configured to be programmed to a voltage indicative of the new word.
19 . The memory device of claim 12 wherein the memory control circuitry is configured to read only most significant bits of the programmed new word during a read operation.Cited by (0)
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