US2012161274A1PendingUtilityA1
Superjunction semiconductor device
Est. expiryJun 29, 2025(expired)· nominal 20-yr term from priority
H10D 62/111
42
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Claims
Abstract
A superjunction semiconductor device includes an edge p pillar, an active region, and a termination region. The edge p pillar has a rectangular ring shape with rounded corners. The edge p pillar has an outer region surrounding the active region and an inner region on in the sides of the active region. The active region has active p pillars and active n pillars having vertical stripe shapes. The active p pillars and the active n pillars are alternately arranged horizontally in the active region. The termination region includes termination n pillars and termination p pillars alternately arranged around the edge p pillar.
Claims
exact text as granted — not AI-modified1 .- 10 . (canceled)
11 . A superjunction semiconductor device comprising:
an edge p pillar having a first width and a rectangular ring shape with rounded corners; an active region surrounded by the edge p pillar, the active region having active p pillars having vertical stripe shapes with a second width twice the first width and active n pillars, the active p pillars and the active n pillars being alternately arranged horizontally in the active region; and a termination region including termination n pillars and termination p pillars alternately arranged around the edge p pillar.
12 . The superjunction semiconductor device of claim 11 , wherein the distance between the central axis of each side of the edge p pillar and the vertical central axis of the corresponding active p pillar disposed closest to each side of the edge p pillar is equal to half the distance between the vertical central axes of neighboring active p pillars.
13 . The superjunction semiconductor device of claim 11 , wherein the widths of the upper and lower parts of the active p pillars are gradually decreased or increased toward each end of the upper and lower parts in the corners of the active region.
14 . The superjunction semiconductor device of claim 13 , wherein the widths of the upper and lower parts of the active p pillars are gradually decreased when the quantity of p charges is larger than the quantity of n charges and gradually increased when the quantity of p charges is smaller than the quantity of n charges.
15 . The superjunction semiconductor device of claim 11 , further comprising subsidiary p pillars arranged in the active n pillars to compensate for the small quantity of p charges in the active p pillars in the corners of the active region.
16 . The superjunction semiconductor device of claim 15 , wherein the subsidiary p pillars have bar shapes vertically arranged in the active n pillars in the corners of the active region.
17 . The superjunction semiconductor device of claim 15 , wherein the subsidiary p pillars are in the form of islands arranged at predetermined intervals in the active n pillars in the corners of the active region.
18 . The superjunction semiconductor device of claim 15 , wherein the subsidiary p pillars have bent belt shapes arranged along the inner side of and contacting the edge p pillar in the active n pillars in the corners of the active region.
19 . A superjunction semiconductor device comprising:
an active region having active p pillars and active n pillars having vertical stripe shapes, the active p pillars and the active n pillars being alternately arranged horizontally in the active region; an edge p pillar having a rectangular ring shape with rounded corners, the edge p pillar including an outer region surrounding the active region and an inner region disposed on the sides of the active region; and a termination region including termination n pillars and termination p pillars alternately arranged around the edge p pillar.
20 . The superjunction semiconductor device of claim 19 , wherein the width of the corners, and upper and lower parts of the edge p pillar where only the outer region is arranged is equal to half the width of each of the active p pillars.
21 . The superjunction semiconductor device of claim 20 , wherein the width of the edge p pillar where both the outer region and the inner region are arranged is identical to the width of each of the active p pillars.
22 . The superjunction semiconductor device of claim 19 , wherein the distance between the boundary between the outer region and the inner region and the vertical central axis of the active p pillar disposed closest to the edge p pillar is identical to the distance between the vertical central axes of neighboring active p pillars.
23 . The superjunction semiconductor device of claim 19 , wherein the widths of the upper and lower parts of the active p pillars are gradually decreased or increased toward each end of the upper and lower parts in the corners of the active region.
24 . The superjunction semiconductor device of claim 23 , wherein the widths of the upper and lower parts of the active p pillars are gradually decreased when the quantity of p charges is larger than the quantity of n charges and gradually increased when the quantity of p charges is smaller than the quantity of n charges.
25 . The superjunction semiconductor device of claim 19 , further comprising subsidiary p pillars arranged in the active n pillars to compensate for the small quantity of p charges in the active p pillars in the corners of the active region.
26 . The superjunction semiconductor device of claim 25 , wherein the subsidiary p pillars have bar shapes vertically arranged in the active n pillars in the corners of the active region.
27 . The superjunction semiconductor device of claim 25 , wherein the subsidiary p pillars are in the form of islands arranged at predetermined intervals in the active n pillars in the corners of the active region.
28 . The superjunction semiconductor device of claim 25 , wherein the subsidiary p pillars have bent belt shapes arranged along the inner side of and contacting the edge p pillar in the active n pillars in the corners of the active region.
29 . A superjunction semiconductor device comprising:
an active region including active p pillars and active n pillars having vertical stripe shapes alternately arranged horizontally in the active region; and island p regions arranged in a matrix form at predetermined intervals in the corners of the active region, the island p regions being arranged in n regions having the same impurity concentration as that of the active n pillars; and an edge p pillar having a rectangular ring shape with rounded corners surrounding the active region.
30 . The superjunction semiconductor device of claim 29 , further comprising a termination region including termination n pillars and termination p pillars alternately arranged around the edge p pillar.
31 . A superjunction semiconductor device comprising:
an active region including active p pillars and active n pillars having vertical stripe shapes alternately arranged horizontally in the active region; and subsidiary p pillars arranged in the active n pillars in corners of the active region, the subsidiary p pillars compensating for an imbalance between the quantity of p charges and the quantity of n charges; and an edge p pillar having a rectangular ring shape with rounded corners surrounding the active region.
32 . The superjunction semiconductor device of claim 31 , wherein the subsidiary p pillars have bar shapes vertically arranged in the active n pillars in the corners of the active region.
33 . The superjunction semiconductor device of claim 31 , wherein the subsidiary p pillars are in the form of islands arranged at predetermined intervals in the active n pillars in the corners of the active region.
34 . The superjunction semiconductor device of claim 31 , wherein the subsidiary p pillars have bent belt shapes arranged along the inner side of and contacting the edge p pillar in the active n pillars in the corners.Cited by (0)
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