US2012222620A1PendingUtilityA1

Atomic Layer Deposition Carousel with Continuous Rotation and Methods of Use

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Assignee: YUDOVSKY JOSEPHPriority: Mar 1, 2011Filed: Mar 1, 2011Published: Sep 6, 2012
Est. expiryMar 1, 2031(~4.6 yrs left)· nominal 20-yr term from priority
Inventors:Joseph Yudovsky
C23C 16/45578C23C 16/44C23C 16/45551C23C 16/458C23C 16/54H10P 72/7618H10P 72/0462H10P 14/20
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Claims

Abstract

Provided are atomic layer deposition apparatus and methods including a rotating wheel with a plurality of substrate carriers for continuous processing of substrates. The processing chamber may have a loading station on the front end which is configured with one or more robots to load and unload substrates from the substrate carriers without needing to stop the rotating wheel.

Claims

exact text as granted — not AI-modified
1 . A deposition system, comprising:
 a processing chamber;   a rotatable wheel disposed inside the processing chamber, the wheel having a plurality of circumferentially distributed substrate carriers; and   at least one gas distribution plate inside the processing chamber, the gas distribution plate having a plurality of elongate gas ports that direct flows of gases toward the substrate carriers; and   a loading station on a front end of the processing chamber, the loading station having a first robot that loads a substrate onto a substrate carrier and a second robot that unloads a processed substrate from a substrate carrier.   
     
     
         2 . The deposition system of  claim 1 , wherein the loading station is isolated from ambient environment. 
     
     
         3 . The deposition system of  claim 1 , wherein the loading station comprises a first substrate buffer region accessible to the first robot and a second substrate buffer region accessible to the second robot. 
     
     
         4 . The deposition system of  claim 1 , further comprising at least one load lock chamber on a front end of the loading station, the load lock chamber isolating the loading station and the processing chamber from the ambient environment. 
     
     
         5 . The deposition system of  claim 4 , wherein there are two load lock chambers, a first load lock chamber that introduces substrates to the loading station from the ambient environment and a second load lock chamber that removes substrates from the loading station. 
     
     
         6 . The deposition system of  claim 4 , further comprising at least one third robot that transfers substrates to and from the at least one load lock chamber. 
     
     
         7 . The deposition system of  claim 1 , wherein the first robot places a substrate onto a substrate carrier while the wheel is rotating without stopping the wheel. 
     
     
         8 . The deposition system of  claim 1 , wherein the second robot removes a substrate from a substrate carrier while the wheel is rotating without stopping the wheel. 
     
     
         9 . The deposition system of  claim 1 , wherein the rotatable wheel rotates the substrate carriers clockwise and counterclockwise. 
     
     
         10 . The deposition system of  claim 1 , wherein the processing chamber further comprises a substrate heating station. 
     
     
         11 . The deposition system of  claim 1 , wherein the processing chamber further comprises a substrate carrier cleaning station that cleans the substrate carrier after the second robot has removed the substrate from the substrate carrier and before the first robot has placed a substrate onto the substrate carrier. 
     
     
         12 . The deposition system of  claim 1 , at least two gas distribution plates, each gas distribution plate deposits different layers on the substrate. 
     
     
         13 . A deposition system, comprising:
 a processing chamber having a rotatable wheel with a plurality of circumferentially distributed substrate carriers and at least one gas distribution plate having a plurality of elongate gas ports that direct flows of gases toward the substrate carriers;   a loading station on a front end of the processing chamber, the loading station having a first robot that loads a substrate onto a substrate carrier, a second robot that unloads a processed substrate from a substrate carrier, a first buffer region accessible to the first robot and a second buffer region accessible to the second robot; and   a first load lock chamber on a front end of the loading station, the first load lock chamber accessible to the first robot and a second load lock chamber on the front end of the loading station, the second load lock chamber accessible to the second robot.   
     
     
         14 . A method of processing a substrate, comprising:
 rotating a wheel having a plurality of circumferentially distributed substrate carriers;   continuously placing a substrate with a first robot in a loading station onto each substrate carrier not holding a substrate without stopping the rotating wheel;   processing each substrate sequentially while rotating on the wheel; and   continuously removing a processed substrate with a second robot in the loading station from each substrate carrier holding a substrate without stopping the rotating wheel.   
     
     
         15 . The method of  claim 14 , further comprising loading substrates from a first load lock chamber into the loading station with the first robot. 
     
     
         16 . The method of  claim 15 , further comprising placing the substrates into a first buffer region in the loading chamber with the first robot after loading the substrates into the loading chamber. 
     
     
         17 . The method of  claim 14 , further comprising unloading substrates from the loading station into a second load lock chamber with the second robot. 
     
     
         18 . The method of  claim 17 , further comprising placing the substrates into a second buffer region in the loading chamber with the second robot before unloading the substrates. 
     
     
         19 . The method of  claim 14 , further comprising passing the substrate carriers adjacent a carrier cleaning station after a substrate has been removed from the carrier and before a substrate has been placed on the carrier. 
     
     
         20 . The method of  claim 14 , further comprising heating the substrate on a substrate carrier.

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