US2014220301A1PendingUtilityA1
Epitaxial substrate having nano-rugged surface and fabrication thereof
Est. expiryJul 15, 2030(~4 yrs left)· nominal 20-yr term from priority
H10P 50/695H10P 50/642H10P 50/242H10P 14/3402H10P 14/2925H10P 14/2901H10P 14/36H10P 14/20C30B 29/60B82Y 30/00B82Y 40/00Y10T428/24355
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Claims
Abstract
The invention provides an epitaxial substrate and fabrication thereof. The epitaxial substrate according to the invention includes a crystalline substrate. In particular, the crystalline substrate has an epitaxial surface which is nano-rugged and non-patterned. The epitaxial substrate according to the invention thereon benefits a compound semiconductor material in growth of epitaxy films with excellent quality. Moreover, the fabrication of the epitaxial substrate according to the invention has advantages of low cost and rapid production.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An epitaxial substrate, comprising:
a crystalline substrate having an epitaxial surface which is nano-rugged and non-patterned.
2 . The epitaxial substrate of claim 1 , wherein the crystalline substrate is formed of one selected from the group consisting of sapphire, SiC, GaN, GaAs, ZnO, Si, ScAlMgO 4 , SrCu 2 O 2 , YSZ(Yttria-Stabilized Zirconia), LiAlO 2 , LiGaO 2 , Li 2 SiO 3 , LiGeO 3 , NaAlO 2 , NaGaO 2 , Na 2 GeO 3 , Na 2 SiO 3 , Li 3 PO 4 , Li 3 AsO 4 , Li 3 VO 4 , Li 2 MgGeO 4 , Li 2 ZnGeO 4 , Li 2 CdGeO 4 , Li 2 MgSiO 4 , Li 2 ZnSiO 4 , Li 2 CdSiO 4 , Na 2 MgGeO 4 , Na 2 ZnGeO 4 , and Na 2 ZnSiO 4 .
3 . The epitaxial substrate of claim 2 , wherein the epitaxial surface of the crystalline substrate has an average surface roughness (Ra) in a range from 100 nm to 400 nm.
4 . The epitaxial substrate of claim 2 , wherein the epitaxial surface of the crystalline substrate has a mean peak-to-valley height (Rz) in a range from 50 μm to 350 μm.Join the waitlist — get patent alerts
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