US2015086708A1PendingUtilityA1
Method of processing a substrate
Assignee: INTERFACE OPTOELECTRONICS SHENZHEN CO LTDPriority: Nov 19, 2014Filed: Nov 27, 2014Published: Mar 26, 2015
Est. expiryNov 19, 2034(~8.4 yrs left)· nominal 20-yr term from priority
Inventors:Hung-Chieh LuYen-Heng HuangChung-Kai ChenShih-Chieh HuangLi ChengChun-Lin TsengHo-Chieh TsengChiou-Chi ChenChang-Kuei HuangWei-Chung Chuang
B05D 1/322C09J 163/00B05D 1/02C09J 133/12C09J 167/00C09J 5/00G06F 2203/04103G06F 3/041
52
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Claims
Abstract
A method of processing a substrate or panel is disclosed. A substrate having thereon an array of chips is provided. A mask layer is laminated on the substrate. The mask layer has a plurality of openings to reveal active areas of the chips respectively. A spray-coating process is then performed to form an adhesive film in the active areas. The mask layer is then stripped off.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of processing a substrate, comprising:
providing a substrate having thereon a plurality of chips; laminating a mask layer on the substrate, wherein the mask layer has a plurality of openings to reveal active areas of the chips respectively; performing a spray-coating process to form an adhesive film in the active areas; and stripping the mask layer off.
2 . The method of processing a substrate according to claim 1 , wherein the spray-coating process employs an adhesive material having a low viscosity that ranges between 10 centipoise (cps) and 3000 cps.
3 . The method of processing a substrate according to claim 2 , wherein the adhesive material having a low viscosity comprises epoxy resins, polyesters, or polymethyl methacrylate (PMMA).
4 . The method of processing a substrate according to claim 1 , wherein the adhesive film has a solvent residue rate that is greater than 1%.
5 . The method of processing a substrate according to claim 1 , wherein the adhesive film has a thickness that is smaller than 5 micrometers.
6 . The method of processing a substrate according to claim 1 , wherein the adhesive film has a uniformity that is smaller than 10%.
7 . The method of processing a substrate according to claim 1 , wherein the adhesive film has a surface roughness Ra that is greater than 0.01 micrometers.
8 . The method of processing a substrate according to claim 1 , wherein the adhesive film has a surface profile variation of about 0.3 μm/mm.
9 . The method of processing a substrate according to claim 1 , wherein the mask layer is a releasable adhesive.
10 . The method of processing a substrate according to claim 1 , wherein the mask layer is a metal mask.
11 . The method of processing a substrate according to claim 1 , wherein the substrate comprises a transparent substrate and at least one sensor electrode layer.
12 . The method of processing a substrate according to claim 1 , wherein the plurality of chips are arranged in an array and are separated from one another by a cutting lane.Cited by (0)
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