US2015243614A1PendingUtilityA1

Semiconductor device

Assignee: RENESAS ELECTRONICS CORPPriority: Jun 7, 2013Filed: May 13, 2015Published: Aug 27, 2015
Est. expiryJun 7, 2033(~6.9 yrs left)· nominal 20-yr term from priority
H10W 74/00H10W 90/297H10W 70/60H10W 90/26H10W 90/271H10W 72/0198H10W 72/877H10W 90/754H10W 72/29H10W 72/952H10W 72/934H10W 72/9415H10W 72/9226H10W 72/923H10W 90/00H10W 72/07236H10W 72/073H10W 72/072H10W 72/241H10W 90/724H10W 90/722H10W 72/248H10W 72/247H10W 72/252H10W 72/242H10W 72/222H10W 72/244H10W 72/234H10W 72/01257H10W 72/01255H10W 72/01225H10W 72/01235H10W 90/734H10W 90/732H10W 74/15H10W 74/147H10W 72/07355H10W 72/981H10W 72/351H10W 70/69H10W 90/701H10W 74/117H10W 74/012H10W 72/30H10W 70/635H10W 70/479H10W 70/65H10W 72/90H01L 23/49816H01L 23/49861H01L 24/06H01L 23/49827H01L 24/29H01L 2224/02163H01L 23/49838H01L 2224/325
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Claims

Abstract

A semiconductor chip and a wiring board are coupled to each other through conductor posts. The centers of conductor posts situated above openings at the outermost periphery shift from the centers of the openings in a direction away from the center of the semiconductor chip. When a region where each of the conductor posts and an insulating layer are overlapped with each other is designated as an overlapped region, the width of the overlapped region more on the inner side than the opening is smaller than the width of the overlapped region more on the outer side than the opening. Thus, while stress applied to the conductor posts is relaxed, coupling reliability between the semiconductor chip and the wiring board is retained.

Claims

exact text as granted — not AI-modified
1 . A semiconductor device comprising:
 a wiring board having a plurality of electrodes, and   a semiconductor chip which is mounted over the wiring board and coupled to the electrodes via solder,   wherein the semiconductor chip includes a rectangular substrate, an insulating film which is formed over the substrate, a plurality of openings which are formed in the insulating film and arranged along the first side of the substrate, a plurality of electrode pads which are situated in the respective openings, and conductor posts which are formed over the respective electrode pads and coupled to the solder and at least part of the periphery of each of which is situated over the insulating film;   wherein when a region where each of the conductor posts is overlapped with the insulating film is designated as an overlapped region, a first width which is the width of the overlapped region situated on a first straight line extending from the center of a first conductor post closest to one end of the first side as a starting point to the center of the substrate as an end point is smaller than a second width which is the width of the overlapped region on an extension line extending in a direction passing through the center of the first conductor post of the first straight line, and   wherein a second straight line passing through the center of the first conductor post and the center of a first opening overlapped with the first conductor post and the first side intersect with each other at an angle other than 90°.   
     
     
         2 - 7 . (canceled)

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