US2016209322A1PendingUtilityA1
Peakforce Photothermal-Based Detection of IR Nanoabsorption
Est. expiryNov 13, 2028(~2.3 yrs left)· nominal 20-yr term from priority
Inventors:Gregory Olegovic Andreev
G01N 21/171G01N 2201/12G01Q 30/02B82Y 35/00G01N 21/3563G01N 2201/10G01Q 60/32G01N 2201/06113G01Q 30/20
63
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
An apparatus and method of performing photothermal chemical nanoidentification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample separation being less than about 10 nm. Then, IR electromagnetic energy having a selected frequency, ω, is directed towards the tip. Using PFT mode AFM operation, absorption of the energy at the region of interest is identified. calorimetry may also be performed with the photothermal PFT system.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An apparatus for measuring IR nanoabsorption of a sample, the apparatus comprising:
a probe interacting with the sample in an oscillating mode that uses feedback to control the interaction between the probe and the sample, and wherein the feedback is based on a substantially instantaneous force on the probe in each oscillation cycle; a position detector for detecting a motion of the probe; a monochromatic light source mounted overhead of the probe for directing monochromatic light having a selected frequency, ω, towards a tip of the probe so as to produce a localized enhanced electric field between the tip and the sample; a controller that determines a substantially instantaneous force between the probe and the sample from the detected motion of the probe and identifies a change in a mechanical property of the sample induced by the localized enhanced electric field; and wherein a stiffness of the probe is greater than a stiffness of the sample.
2 . The apparatus of claim 1 , wherein the the tip is metallized with a layer of one of Platinum Silicide and Platinum Iridium, and wherein the probe includes a cantilever having a spring constant between about 10-40 N/m.
3 . The apparatus of claim 2 , wherein the probe is a silicon probe.Cited by (0)
No later patents cite this yet.
References (0)
No backward citations on record.