Voltage Rail Monitoring to Detect Electromigration

Abstract

A method detects electromigration in an electronic device. An integrated circuit, which is within an electronic device, is quiescented. An isolation power switch applies a test voltage from a field power source to a target voltage rail in the integrated circuit. An isolation power switch isolates the target voltage rail from the field power source. A voltage sensor coupled to the target voltage rail measures a field voltage decay rate for the target voltage rail. A voltage record comparator logic within the integrated circuit compares the field voltage decay rate to an initial voltage decay rate for the target voltage rail. In response to a difference between the field voltage decay rate and the initial voltage decay rate for the target voltage rail exceeding a predetermined limit, a signal is sent to an alarm associated with the electronic device.

What is claimed is: 
     
         1 . A method for detecting electromigration in an electronic device, the method comprising:
 quiescenting an integrated circuit that is within an electronic device;   applying, via an isolation power switch, a test voltage from a field power source to a target voltage rail in the integrated circuit, wherein the test voltage is below an operational voltage for transistors within the integrated circuit;   isolating, via the isolation power switch, the target voltage rail from the field power source;   measuring, by a voltage sensor coupled to the target voltage rail, a field voltage decay rate for the target voltage rail, wherein the voltage sensor couples the target voltage rail to a reference voltage source;   comparing, via a voltage record comparator logic within the integrated circuit, the field voltage decay rate to an initial voltage decay rate for the target voltage rail; and   in response to a difference between the field voltage decay rate and the initial voltage decay rate for the target voltage rail exceeding a predetermined limit, sending, via an output device coupled to the voltage record comparator logic, a signal to an alarm associated with the electronic device, wherein the difference between the initial voltage decay rate and the field voltage decay rate for the target voltage rail has been predetermined to be a result of current leakage in the integrated circuit.   
     
     
         2 . The method of  claim 1 , wherein the initial voltage decay rate was recorded upon an installation of the integrated circuit into the electronic device. 
     
     
         3 . The method of  claim 1 , wherein the current leakage is a result of electromigration in the integrated circuit. 
     
     
         4 . The method of  claim 1 , wherein the initial voltage decay rate was recorded upon a final manufacturing of the integrated circuit. 
     
     
         5 . The method of  claim 1 , wherein the initial voltage decay rate was recorded upon a final installation of the integrated circuit into the electronic device. 
     
     
         6 . The method of  claim 1 , wherein the reference voltage source is a ground. 
     
     
         7 . The method of  claim 1 , wherein the reference voltage source is a reference voltage rail. 
     
     
         8 . The method of  claim 1 , wherein the reference voltage rail provides a bias voltage to the target voltage rail. 
     
     
         9 . The method of  claim 1 , wherein the output device is an input/output connector to a test device. 
     
     
         10 . The method of  claim 1 , wherein the output device is an alarm indicator.