US2018135160A1PendingUtilityA1
Method for controlling a gas supply to a process chamber, controller for controlling a gas supply to a process chamber, and apparatus
Est. expirySep 24, 2033(~7.2 yrs left)· nominal 20-yr term from priority
C23C 14/544H01J 37/3299C23C 14/0042H01J 37/32449H01J 37/32981
61
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Claims
Abstract
A method for controlling a gas supply to a process chamber is provided. The method includes: measuring a gas parameter by each of two or more sensors provided in the process chamber; determining a combined gas parameter from the measured gas parameters; and controlling the gas supply to the process chamber based on the determined combined gas parameter.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for controlling a gas supply to a process chamber, comprising:
measuring a gas parameter by each of two or more sensors provided in the process chamber; determining a combined gas parameter from the measured gas parameters; and controlling the gas supply to the process chamber based on the determined combined gas parameter, wherein controlling the gas supply includes adjusting the gas supply such that the gas parameter measured by at least one of the two or more sensors corresponds to the combined gas parameter.
2 . The method of claim 1 , wherein the gas parameter is at least one of a gas concentration, a mass and a pressure.
3 . The method of claim 1 , wherein measuring the gas parameter includes measuring, by each of the two or more sensors, two or more gas parameter values within a time interval.
4 . The method of claim 3 , wherein the combined gas parameter is determined from the two or more gas parameter values.
5 . The method of claim 3 , further comprising:
determining, for each sensor, a sensor combined value from the gas parameter values measured by the respective sensor in the time interval.
6 . The method of claim 5 , wherein the combined gas parameter is determined based on the sensor combined values.
7 . The method of claim 1 , wherein the combined gas parameter is an average gas parameter.
8 . The method of claim 1 , wherein the gas supply is further controlled based on a process power.
9 . The method of claim 1 , wherein controlling the gas supply utilizes P, PI or PID control.
10 . The method of claim 1 , wherein the controlling the gas supply includes controlling a gas flow through one or more gas inlets.
11 . The method of claim 1 , wherein the method is performed during a reactive process a reactive sputtering process.
12 . A controller for controlling a gas supply to a process chamber, wherein two or more sensors each configured to measure a gas parameter are provided in the process chamber, the controller being configured to:
determine a combined gas parameter of the gas parameters measured by the two or more sensors; and control the gas supply to the process chamber based on the determined combined gas parameter, the controller being configured to adjust the gas supply such that the gas parameter measured by at least one of the two or more sensors corresponds to the combined gas parameter.
13 . An apparatus, comprising:
a process chamber having at least one gas inlet; two or more sensors each configured to measure a gas parameter in the process chamber; and a controller according to claim 12 .
14 . The apparatus of claim 13 , wherein at least one of the two or more sensors is selected from the group including a lambda sensor, a pressure gauge, a mass spectrometer and a residual gas analyzer.Join the waitlist — get patent alerts
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