US2019221685A1PendingUtilityA1
Photovoltaic device including a p-n junction and method of manufacturing
Est. expiryFeb 1, 2033(~6.5 yrs left)· nominal 20-yr term from priority
H01L 31/073H01L 31/02966H01L 31/1832H01L 31/1864Y02E10/543Y02P70/521H10F 71/1253H10F 71/128H10F 10/162H10F 77/1237Y02P70/50Y02E10/547
61
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
A photovoltaic device includes a substrate structure and a p-type semiconductor absorber layer. A photovoltaic device may include a CdSeTe layer. A process for manufacturing a photovoltaic device includes forming a CdSeTe layer over a substrate. The process includes forming a p-type cadmium selenide telluride absorber layer.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A photovoltaic structure, comprising:
a substrate structure comprising a transparent conductive oxide (TCO) layer; and an absorber layer formed over the substrate structure, wherein:
a p-n junction is formed between the absorber layer and the substrate structure,
the absorber layer comprises a p-type cadmium selenide telluride layer,
the p-type cadmium selenide telluride layer comprises a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1,
the absorber layer has a gradient of selenium, whereby a concentration of selenium varies through a thickness of the absorber layer, and
the absorber layer has higher selenium concentration adjacent to the substrate structure and decreasing through the thickness of the absorber layer.
2 . The photovoltaic structure of claim 1 , wherein the gradient of selenium in the CdSe x Te 1−x compound has a selenium to tellurium ratio such that x varies in value through a thickness of the absorber layer, and wherein x has a value within a range of 0.01 to 0.25.
3 . The photovoltaic structure of claim 1 , wherein the substrate structure further comprises a buffer layer and a barrier layer.
4 . The photovoltaic structure of claim 1 , further comprising a back contact formed over the absorber layer.
5 . The photovoltaic structure of claim 1 , wherein the concentration of selenium varies through a thickness of the absorber layer in a continuous gradient.
6 . The photovoltaic structure of claim 1 , wherein the concentration of selenium varies through a thickness of the absorber layer in a stepwise gradient.
7 . The photovoltaic structure of claim 1 , wherein the absorber layer further comprises a dopant.
8 . The photovoltaic structure of claim 1 , wherein the absorber layer further comprises a dopant, and wherein the dopant includes copper in a concentration of 0.5 ppm to 1.0 ppm in the absorber layer.
9 . The photovoltaic structure of claim 1 , wherein the back contact comprises zinc.
10 . The photovoltaic structure of claim 1 , wherein the back contact comprises an alloy of cadmium, tellurium, and zinc.
11 . The photovoltaic structure of claim 1 , wherein the absorber layer consists of p-type material.
12 . A method for forming a photovoltaic structure, comprising:
providing a substrate structure comprising a transparent conductive oxide (TCO) layer; depositing a CdSeTe layer over the substrate structure; alloying the CdSeTe layer whereby an absorber layer is formed over the substrate structure, wherein:
the absorber layer comprises a p-type cadmium selenide telluride layer,
the p-type cadmium selenide telluride layer is composed of a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1; and
depositing a back contact over the CdSeTe layer; wherein:
the absorber layer comprises a p-type cadmium selenide telluride layer,
the p-type cadmium selenide telluride layer is composed of a CdSe x Te 1−x compound, wherein a value of x is between 0 and 1; and
the absorber layer has a compositional profile having a gradient of selenium, wherein a concentration of Se is greater adjacent the TCO layer than adjacent the back contact.
13 . The method of claim 12 , wherein the step of depositing the CdSeTe layer includes:
co-evaporating cadmium telluride powder and cadmium selenide powder.
14 . The method of claim 12 , wherein the step of depositing the CdSeTe layer includes:
evaporating a pre-alloyed cadmium telluride selenide powder.
15 . The method of claim 12 , wherein the step of depositing the CdSeTe layer includes:
evaporating a powder alloy comprising cadmium, and at least one of tellurium or selenium, wherein a composition of the powder is tailored to deposit the CdSe x Te 1−x layer, with a compositional gradient wherein x varies across a thickness of the CdSe x Te 1−x layer.
16 . The method of claim 12 , wherein the CdSe x Te 1−x compound has a compositional profile such that x varies in value through a thickness of the cadmium selenide telluride layer, and the value of x is in a range of 0.01 to 0.40.
17 . The method of claim 12 , further comprising depositing a dopant.
18 . The method of claim 12 , wherein the alloying step occurs concurrently with the step of depositing the CdSeTe layer over the substrate structure.
19 . The method of claim 12 , wherein the alloying step occurs after the step of depositing the CdSeTe layer over the substrate structure.
20 . The method of claim 12 , wherein the alloying step further comprises:
annealing with a CdCl 2 flux at a temperature in a range from 420° C. to 460° C. for a duration in a range from five minutes to sixty minutes.Join the waitlist — get patent alerts
Track US2019221685A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.