US2020078901A1PendingUtilityA1
Polishing pad for wafer polishing apparatus
Est. expirySep 6, 2038(~12.1 yrs left)· nominal 20-yr term from priority
Inventors:Seung Won Lee
B24B 37/245B24B 37/22B24B 37/24B24D 3/34B24D 13/14
52
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Claims
Abstract
A polishing pad for a wafer polishing apparatus according to an embodiment includes: a first NAP layer having an upper surface in direct contact with a wafer; a second NAP layer disposed under the first NAP layer to support the first NAP layer; and a polyethylene terephthalate film (PET film) layer disposed under the second NAP layer to be attached to a surface plate.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A polishing pad for a wafer polishing apparatus comprising:
a first NAP layer having an upper surface in direct contact with a wafer;
a second NAP layer disposed under the first NAP layer to support the first NAP layer; and
a polyethylene terephthalate film (PET film) layer disposed under the second NAP layer to be attached to a surface plate.
2 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein a compressibility of the first NAP layer is 12% or less.
3 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein a hardness of the first NAP layer is 22° or more.
4 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein a compressibility of the second NAP layer is 10% to 30%.
5 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein an elastic modulus of the second NAP layer is 95% or more.
6 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein a hardness of the second NAP layer is 19° to 26°.
7 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein thicknesses of the first and second NAP layers are 0.30 to 0.40 mm, respectively.
8 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein a thickness of the PET film layer is 0.10 to 0.30 mm.
9 . The polishing pad for the wafer polishing apparatus of claim 1 , wherein the first and second NAP layers are a suede material including polyurethane.
10 . The polishing pad for the wafer polishing apparatus of claim 1 , further comprising an adhesive layer for combining the first NAP layer and the second NAP layer.Join the waitlist — get patent alerts
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