Inspecting a slab of material

Abstract

A system for inspecting a slab of material may include an optical fiber, a broadband light source configured to emit light having wavelengths of 780-1800 nanometers over the optical fiber, a beam-forming assembly configured to receive the light over the optical fiber and direct the light toward a slab of material, the beam-forming assembly may be configured to maintain the position of one or more elements within the beam-forming assembly despite changes in environmental temperature; a computer-controlled etalon filter configured to receive the light over the optical fiber, filter the light, and direct the light over the optical fiber; and a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.

1 . A system for inspecting a slab of material, the system comprising:
 single mode optical fiber;   a broadband light source configured to emit light with wavelengths in a range from 780 nanometers (nm) to 1800 nm over the optical fiber;   a beam-forming assembly configured to receive the light over the optical fiber and direct the light toward a slab of material;   a computer-controlled etalon filter configured to receive the light over the optical fiber either before the light is directed toward the slab of material or after the light has been reflected from or transmitted through the slab of material, filter the light, and direct the light over the optical fiber; and   a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.   
     
     
         2 . The system of  claim 1 , wherein the broadband light source is configured to emit light with wavelengths in a range of 780 nm to 1000 nm. 
     
     
         3 . The system of  claim 1 , wherein the broadband light source is configured to emit light with wavelengths in a range of 800 nm to 1000 nm. 
     
     
         4 . The system of  claim 3 , wherein the computer-controlled spectrometer comprises a silicon-based detector. 
     
     
         5 . The system of  claim 1 , wherein the broadband light source is configured to emit light with wavelengths in a range of 1100 nm to 1800 nm. 
     
     
         6 . The system of  claim 1 , wherein the broadband light source is configured to emit light with wavelengths in a range of 1200 nm to 1500 nm. 
     
     
         6 . The system of  claim 6 , wherein the computer-controlled spectrometer comprises an Indium Gallium Arsenide detector. 
     
     
         7 . The system of  claim 1 , wherein the broadband light source comprises a Superluminescent Light Emitter Device. 
     
     
         8 . The system of  claim 1 , wherein each of the single mode fiber, the beam-forming assembly, the computer-controlled etalon filter, and the computer-controlled spectrometer are configured to operate in the same wavelength range as the light emitted by the broadband light source. 
     
     
         9 . A system for inspecting a slab of material, the system comprising:
 single mode optical fiber;   a broadband light source configured to emit light over the optical fiber;   a beam-forming assembly configured to:
 receive the light over the optical fiber; 
 split the light, at a beam splitter, into first and second portions after receiving the light over the optical fiber; 
 direct the first portion of the light toward the slab of material; 
 direct the second portion of the light onto a reflector that is maintained at a substantially constant distance from the beam splitter; 
 combine the first portion of the light after being reflected from the slab of material and the second portion of the light after being reflected from the reflector; and 
 direct the combined light over the optical fiber; 
   a computer-controlled etalon filter configured to receive the light over the optical fiber either before the light is directed toward the slab of material or after the light has been reflected from or transmitted through the slab of material, filter the light, and direct the light over the optical fiber; and   a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.   
     
     
         10 . The system of  claim 9 , wherein the beam-forming assembly is comprised of materials having a low coefficient of thermal expansion such that in response to an increase or decrease in a temperature of the system, the reflector is maintained at a substantially constant distance from the beam splitter. 
     
     
         11 . The system of  claim 10 , wherein the beam-forming assembly is comprised of Invar. 
     
     
         12 . The system of  claim 9 , further comprising a temperature controller that is configured to maintain the beam-forming assembly at a substantially constant temperature. 
     
     
         13 . The system of  claim 12 , wherein the temperature controller comprises a temperature sensor, a heater, and feedback electronics. 
     
     
         14 . The system of  claim 12 , wherein the temperature controller comprises a thermoelectric cooler.