Inventor · disambiguated record
Wojciech Jan Walecki
Also filed as: WALECKI WOJCIECH · WALECKI WOJCIECH J · WALECKI WOJCIECH JAN
26 granted patents·5 pending applications·48 citations·filing 2003–2021
93Inventor score
Files withAPPLEJACK 199 LP26WALECKI WOJCIECH JAN2AHBEE 1 L P1SUNRISE OPTICAL LLC1WALECKI WOJCIECH J1
Top patents by PatentIndex Score
31 records- 0190US10209058B1Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2018·Granted Feb 19, 2019·5 cites·16 claims
- 0289US9915564B1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2017·Granted Mar 13, 2018·7 cites·20 claims
- 0385US10113860B1Inspecting a multilayer sampleAPPLEJACK 199 LP·Filed 2017·Granted Oct 30, 2018·4 cites·17 claims
- 0482US10416430B2Focusing of optical devicesAPPLEJACK 199 LP·Filed 2017·Granted Sep 17, 2019·3 cites·25 claims
- 0581US10480925B2Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Nov 19, 2019·1 cites·15 claims
- 0679US10203198B2Measurement of surface topography of a work-pieceAPPLEJACK 199 LP·Filed 2017·Granted Feb 12, 2019·2 cites·25 claims
- 0774US11226190B2Measurement of thickness and topography of a slab of materialsWALECKI WOJCIECH JAN·Filed 2020·Granted Jan 18, 2022·1 cites·20 claims
- 0873US10551163B2Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2019·Granted Feb 4, 2020·1 cites·19 claims
- 0972US10563975B1Dual-sensor arrangment for inspecting slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Feb 18, 2020·1 cites·20 claims
- 1072US10036624B1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Jul 31, 2018·1 cites·20 claims
- 1171US10655949B2Inspecting a multilayer sampleAPPLEJACK 199 LP·Filed 2018·Granted May 19, 2020·1 cites·19 claims
- 1271US10553623B2Non-contact measurement of a stress in a film on a substrateAPPLEJACK 199 LP·Filed 2017·Granted Feb 4, 2020·1 cites·8 claims
- 1363US2020182607A1Dual-sensor arrangment for inspecting slab of materialAPPLEJACK 199 LP·Filed 2020·Application pending·0 cites
- 1462US10533841B2Measurement of surface topography of a work-pieceAPPLEJACK 199 LP·Filed 2019·Granted Jan 14, 2020·0 cites·20 claims
- 1562US2020191550A1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2019·Application pending·0 cites
- 1662US2020320724A1Characterization of specular surfacesAPPLEJACK 199 LP·Filed 2020·Application pending·0 cites
- 1761US11163144B2Focusing of optical devicesAPPLEJACK 199 LP·Filed 2021·Granted Nov 2, 2021·0 cites·20 claims
- 1861US10935777B2Focusing of optical devicesAPPLEJACK 199 LP·Filed 2019·Granted Mar 2, 2021·0 cites·20 claims
- 1959US11073372B2Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2020·Granted Jul 27, 2021·0 cites·12 claims
- 2059US10964730B2Non-contact measurement of a stress in a film on a substrateAPPLEJACK 199 LP·Filed 2020·Granted Mar 30, 2021·0 cites·11 claims
- 2159US7502121B1Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materialsAHBEE 1 L P·Filed 2004·Granted Mar 10, 2009·9 cites·4 claims
- 2258US10168138B1Inspecting a slab of materialAPPLEJACK 199 LP·Filed 2018·Granted Jan 1, 2019·0 cites·20 claims
- 2358US7116429B1Determining thickness of slabs of materials by inventorsWALECKI WOJCIECH J·Filed 2003·Granted Oct 3, 2006·11 cites·11 claims
- 2457US11885609B2Wafer thickness, topography, and layer thickness metrology systemWALECKI WOJCIECH JAN·Filed 2021·Granted Jan 30, 2024·0 cites·3 claims
- 2556US10621739B2Characterization of specular surfacesAPPLEJACK 199 LP·Filed 2018·Granted Apr 14, 2020·0 cites·16 claims
- 2654US11112234B2Multi-probe gauge for slab characterizationAPPLEJACK 199 LP·Filed 2020·Granted Sep 7, 2021·0 cites·10 claims
- 2745US10584958B2Error reduction in measurement of samples of materialsAPPLEJACK 199 LP·Filed 2018·Granted Mar 10, 2020·0 cites·22 claims
- 2844US10890434B2Inspecting a multilayer sampleAPPLEJACK 199 LP·Filed 2018·Granted Jan 12, 2021·0 cites·20 claims
- 2941US2019243148A1Optical device employing electrically addressed spatial light modulatorAPPLEJACK 199 LP·Filed 2018·Application pending·0 cites
- 3040US11105611B2Non-contact measurement of a stress in a film on substrateAPPLEJACK 199 LP·Filed 2018·Granted Aug 31, 2021·0 cites·14 claims
- 3137US2011193954A1Apparatus for the measurement of the topography and photoelectric properties of transparent surfacesSUNRISE OPTICAL LLC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →