Plasma processing method and plasma processing apparatus
Abstract
A method for processing a substrate includes: supplying a pulsed source RF signal to an antenna disposed above a chamber, the pulsed source RF signal including a plurality of source cycles each having a source operating state and a source non-operating state after the source operating period; and supplying a pulsed bias RF signal to a lower electrode disposed in a substrate support provided in the chamber, the pulsed bias RF signal including a plurality of bias cycles having a same pulse frequency as that of the plurality of source cycles, each bias cycle having a bias operating state during a bias operating period and a bias non-operating state during a bias non-operating period after the bias operating period. A transition timing to the bias operating state in each bias cycle is delayed with respect to a transition timing to the source operating state in a corresponding source cycle.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for processing a substrate comprising:
providing a plasma processing apparatus including a chamber, a substrate support disposed in the chamber, a lower electrode disposed in the substrate support, and an antenna disposed above the chamber; supplying a pulsed source RF signal to the antenna, the pulsed source RF signal including a plurality of source cycles, each source cycle having a source operating state during a source operating period and a source non-operating state during a source non-operating period after the source operating period; and supplying a pulsed bias RF signal to the lower electrode, the pulsed bias RF signal including a plurality of bias cycles having a same pulse frequency as that of the plurality of source cycles, each bias cycle having a bias operating state during a bias operating period and a bias non-operating state during a bias non-operating period after the bias operating period, wherein a transition timing to the bias operating state in each bias cycle is delayed with respect to a transition timing to the source operating state in a corresponding source cycle, the source non-operating period overlaps with the bias non-operating period, and the bias operating period in each bias cycle overlaps with the source operating period in a next source cycle.
2 . The method according to claim 1 , wherein the source operating state has at least two source power levels, and
the bias operating state has at least two bias power levels.
3 . The method according to claim 2 , wherein the source operating state has a first source power level and a second source power level after the first source power level, the bias operating state has a first bias power level and a second bias power level after the first bias power level, and
the pulsed bias RF signal transitions to the bias operating state during the source non-operating period in each source cycle.
4 . The method according to claim 3 , wherein the pulsed bias RF signal transitions from the first bias power level to the second bias power level during the source non-operating period in each source cycle.
5 . The method according to claim 4 , wherein a transition from the first source power level to the second source power level in each source cycle is substantially synchronized with a transition from the bias operating state to the bias non-operating state in each bias cycle.
6 . The method according to claim 5 , wherein the first source power level is greater than the second source power level.
7 . The method according to claim 5 , wherein the first source power level is less than the second source power level.
8 . The method according to claim 7 , wherein the second bias power level is greater than the first bias power level.
9 . The method according to claim 7 , wherein the second bias power level is less than the first bias power level.
10 . The method according to claim 3 , wherein a transition from the first source power level to the second source power level in each source cycle is substantially synchronized with a transition from the bias operating state to the bias non-operating state in each bias cycle.
11 . The method according to claim 3 , wherein the first source power level is greater than the second source power level.
12 . The method according to claim 3 , wherein the first source power level is less than the second source power level.
13 . The method according to claim 3 , wherein the second bias power level is greater than the first bias power level.
14 . The method according to claim 3 , wherein the second bias power level is less than the first bias power level.
15 . A method for processing a substrate comprising:
providing a plasma processing apparatus including a chamber, a substrate support disposed in the chamber, a lower electrode disposed in the substrate support, and an upper electrode disposed above the substrate support; supplying a pulsed source RF signal to the upper electrode or the lower electrode, the pulsed source RF signal including a plurality of source cycles, each source cycle having a source operating state during a source operating period and a source non-operating state during a source non-operating period after the source operating period; and supplying a pulsed bias RF signal to the lower electrode, the pulsed bias RF signal including a plurality of bias cycles having a same pulse frequency as that of the plurality of source cycles, each bias cycle having a bias operating state during a bias operating period and a bias non-operating state during a bias non-operating period after the bias operating period, wherein a transition timing to the bias operating state in each bias cycle is delayed with respect to a transition timing to the source operating state in a corresponding source cycle, the source non-operating period overlaps with the bias non-operating period, and the bias operating period in each bias cycle overlaps with the source operating period in a next source cycle.
16 . The method according to claim 15 , wherein the source operating state has at least two source power levels, and
the bias operating state has at least two bias power levels.
17 . The method according to claim 16 , wherein the source operating state has a first source power level and a second source power level after the first source power level,
the bias operating state has a first bias power level and a second bias power level after the first bias power level, and the pulsed bias RF signal transitions to the bias operating state during the source non-operating period in each source cycle.
18 . The method according to claim 17 , wherein the pulsed bias RF signal transitions from the first bias power level to the second bias power level during the source non-operating period in each source cycle.
19 . The method according to claim 18 , wherein a transition from the first source power level to the second source power level in each source cycle is substantially synchronized with a transition from the bias operating state to the bias non-operating state in each bias cycle.
20 . The method according to claim 17 , wherein a transition from the first source power level to the second source power level in each source cycle is substantially synchronized with a transition from the bias operating state to the bias non-operating state in each bias cycle.Join the waitlist — get patent alerts
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