US7105266B2ExpiredUtilityA1
Polymers containing oxygen and sulfur alicyclic units and photoresist compositions comprising same
Est. expiryMay 9, 2020(expired)· nominal 20-yr term from priority
G03F 7/0397G03F 7/0395C08F 220/1811G03F 7/0757G03F 7/0392G03F 7/0046G03F 7/039G03F 7/0045
49
PatentIndex Score
1
Cited by
20
References
20
Claims
Abstract
The invention includes polymers that contain a heterocyclic ring, preferably an oxygen- or sulfur-containing ring. The heterocyclic ring is preferably fused to the polymer backbone. The invention also provides photoresists that contain such polymers, particularly for imaging at short wavelengths such as sub-200 nm.
Claims
exact text as granted — not AI-modified1. A photoresist comprising a photoactive component and a polymer that comprises: i) a heteroalicyclic group that does not contain a carbonyl ring member and is fused to the polymer backbone and that contains one or more oxygen or sulfur ring atoms; ii) a carbon alicyclic group fused to the polymer backbone; and iii) polymerized acrylate that comprises a photoacid-labile moiety.
2. The photoresist of claim 1 wherein the heteroalicyclic group has an oxygen ring member.
3. The photoresist of claim 1 wherein the heteroalicyclic group has a sulfur ring member.
4. The photoresist of claim 1 wherein the carbon alicyclic group is a polymerized norbornene group.
5. The photoresist of claim 1 wherein the heteroalicyclic group has a non-hydrogen ring substituent.
6. The photoresist of claim 1 wherein the polymer is a tetrapolymer or pentapolymer.
7. The photoresist of claim 1 wherein the polymer is completely free of aromatic groups.
8. The photoresist of claim 1 wherein the photoacid-labile moiety is a substituent of the heteroalicyclic group or carbon alicyclic group.
9. The photoresist of claim 1 wherein the photoacid-labile moiety is a polymer unit distinct from the heteroalicyclic group and carbon alicyclic group.
10. The photoresist of claim 1 wherein the polymer further comprises lactone or anhydride units.
11. The photoresist of claim 1 wherein the polymer further comprises polymerized maleic anhydride groups.
12. The photoresist of claim 1 wherein the heteroalicyclic group fused to the polymer backbone does not contain an unsaturated oxygen.
13. The photoresist of claim 1 wherein the heteroalicyclic group fused to the polymer backbone does not contain an unsaturated sulfur.
14. The photoresist composition of claim 1 wherein the polymer is at least substantially free of aromatic groups.
15. The photoresist composition of claim 1 wherein the heteroalicyclic group is not an anhydride or lactone.
16. The photoresist composition of claim 1 wherein the heteroalicyclic group contains a single ring oxygen atom.
17. An article of manufacture comprising a microelectronic wafer substrate or a flat panel display substrate having coated thereon a layer of a photoresist composition of claim 1 .
18. A method of forming a positive photoresist relief image, comprising:
(a) applying a coating layer of a photoresist of claim 1 on a substrate; and
(b) exposing and developing the photoresist image to yield a relief image.
19. The method of claim 18 wherein the photoresist layer is exposed with radiation having a wavelength of less than about 200 nm.
20. The method of claim 18 wherein the photoresist layer is exposed with radiation having a wavelength of about 193 nm.Cited by (0)
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