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US7208198B2ExpiredUtilityPatentIndex 98

Chemical vapor deposition methods of forming barium strontium titanate comprising dielectric layers, including such layers having a varied concentration of barium and strontium within the layer

Assignee: MICRON TECHNOLOGY INCPriority: Jul 13, 2001Filed: Jun 28, 2004Granted: Apr 24, 2007
Est. expiryJul 13, 2021(expired)· nominal 20-yr term from priority
Inventors:BASCERI CEMALZOLA NANCY
C23C 16/45523C23C 16/409
98
PatentIndex Score
419
Cited by
157
References
29
Claims

Abstract

The invention includes a chemical vapor deposition method of forming a barium strontium titanate comprising dielectric layer having a varied concentration of barium and strontium, and/or titanium, within the layer. A substrate is positioned within a chemical vapor deposition reactor. Barium and strontium are provided within the reactor by flowing at least one metal organic precursor to the reactor. Titanium is provided within the reactor. One or more oxidizers are flowed to the reactor. In one aspect, conditions are provided within the reactor to be effective to deposit a barium strontium titanate comprising dielectric layer on the substrate from the reactants.

Claims

exact text as granted — not AI-modified
The invention claimed is: 
     
       1. A chemical vapor deposition method of forming a barium strontium titanate-comprising dielectric layer having a varied concentration of barium and strontium within the layer, comprising:
 providing a substrate within a chemical vapor deposition reactor; 
 providing barium and strontium within the reactor by flowing at least one metal organic precursor to the reactor, and providing titanium within the reactor, and flowing a constant composition oxidizer stream to the reactor, under conditions effective to deposit a barium strontium titanate-comprising dielectric layer on the substrate; the barium and strontium being provided within the reactor during all of the deposit of said layer at a substantially constant atomic ratio of barium to strontium; and 
 during said deposit, changing a rate of flow of the constant composition oxidizer stream to the reactor at least once to effect a change in relative atomic concentration of barium to strontium within the deposited barium strontium titanate-comprising dielectric layer. 
 
     
     
       2. The method of  claim 1  comprising changing the rate of flow at least twice. 
     
     
       3. The method of  claim 1  comprising providing the barium and strontium within the reactor by flowing at least two metal organic precursors to the reactor, one of the precursors comprising barium, another of the precursors comprising strontium. 
     
     
       4. The method of  claim 1  comprising providing the barium and strontium within the reactor by flowing at least two metal organic precursors to the reactor, one of the precursors comprising barium, another of the precursors comprising strontium, the one and the another precursors being fed to the reactor as a mixture in a single flow stream. 
     
     
       5. The method of  claim 1  comprising providing the barium and strontium within the reactor during all of the deposit of said layer at substantially constant volumetric flow rates to the reactor. 
     
     
       6. The method of  claim 1  wherein the oxidizer is inorganic. 
     
     
       7. The method of  claim 1  wherein the oxidizer comprises NO x , where “x” is at least 1. 
     
     
       8. The method of  claim 1  wherein the oxidizer comprises NO. 
     
     
       9. The method of  claim 1  wherein the constant composition oxidizer stream comprises multiple oxidizers. 
     
     
       10. A chemical vapor deposition method of forming a barium strontium titanate-comprising dielectric layer having a varied concentration of titanium within the layer, comprising:
 providing a substrate within a chemical vapor deposition reactor; 
 providing barium and strontium within the reactor by flowing at least one metal organic precursor to the reactor, and providing titanium within the reactor, and flowing a constant composition oxidizer stream to the reactor, under conditions effective to deposit a barium strontium titanate-comprising dielectric layer on the substrate; the barium and strontium being provided within the reactor during all of the deposit of said layer at a substantially constant atomic ratio of barium to strontium; and 
 during said deposit, changing a rate of flow of the constant composition oxidizer stream to the reactor at least once to effect a change in atomic concentration of titanium relative to barium and strontium within the deposited barium strontium titanate-comprising dielectric layer. 
 
     
     
       11. The method of  claim 10  wherein the changing of a rate of flow of the oxidizer to the reactor at least once is also effective to effect a change in relative atomic concentration of barium to strontium within the deposited barium strontium titanate-comprising dielectric layer. 
     
     
       12. The method of  claim 10  comprising changing the rate of flow at least twice. 
     
     
       13. The method of  claim 10  wherein the oxidizer is inorganic. 
     
     
       14. The method of  claim 10  wherein the oxidizer comprises NO x , where “x” is at least 1. 
     
     
       15. The method of  claim 10  wherein the oxidizer comprises NO. 
     
     
       16. A chemical vapor deposition method of forming a barium strontium titanate-comprising dielectric layer having a varied concentration of barium and strontium within the layer, comprising:
 providing a substrate within a chemical vapor deposition reactor; 
 providing barium and strontium within the reactor by flowing at least one metal organic precursor to the reactor, and providing titanium within the reactor, and flowing only a single oxidizer to the reactor, under conditions effective to deposit a barium strontium titanate-comprising dielectric layer on the substrate; the barium and strontium being provided within the reactor during all of the deposit of said layer at a substantially constant atomic ratio of barium to strontium; and 
 during said deposit, changing a rate of flow of the single oxidizer to the reactor at least once to effect a change in relative atomic concentration of barium to strontium within the deposited barium strontium titanate-comprising dielectric layer. 
 
     
     
       17. The method of  claim 16  comprising changing the rate of flow at least twice. 
     
     
       18. The method of  claim 16  comprising providing the barium and strontium within the reactor by flowing at least two metal organic precursors to the reactor, one of the precursors comprising barium, another of the precursors comprising strontium. 
     
     
       19. The method of  claim 16  comprising providing the barium and strontium within the reactor by flowing at least two metal organic precursors to the reactor, one of the precursors comprising barium, another of the precursors comprising strontium, the one and the another precursors being fed to the reactor as a mixture in a single flow stream. 
     
     
       20. The method of  claim 16  comprising providing the barium and strontium within the reactor during all of the deposit of said layer at substantially constant volumetric flow rates to the reactor. 
     
     
       21. The method of  claim 16  wherein the oxidizer is inorganic. 
     
     
       22. The method of  claim 16  wherein the oxidizer comprises NO x , where “x” is at least 1. 
     
     
       23. The method of  claim 16  wherein the oxidizer comprises NO. 
     
     
       24. A chemical vapor deposition method of forming a barium strontium titanate-comprising dielectric layer having a varied concentration of titanium within the layer, comprising:
 providing a substrate within a chemical vapor deposition reactor; 
 providing barium and strontium within the reactor by flowing at least one metal organic precursor to the reactor, and providing titanium within the reactor, and flowing only a single oxidizer to the reactor, under conditions effective to deposit a barium strontium titanate-comprising dielectric layer on the substrate; the barium and strontium being provided within the reactor during all of the deposit of said layer at a substantially constant atomic ratio of barium to strontium; and 
 during said deposit, changing a rate of flow of the single oxidizer to the reactor at least once to effect a change in atomic concentration of titanium relative to barium and strontium within the deposited barium strontium titanate-comprising dielectric layer. 
 
     
     
       25. The method of  claim 24  wherein the changing of a rate of flow of the oxidizer to the reactor at least once is also effective to effect a change in relative atomic concentration of barium to strontium within the deposited barium strontium titanate-comprising dielectric layer. 
     
     
       26. The method of  claim 24  comprising changing the rate of flow at least twice. 
     
     
       27. The method of  claim 24  wherein the oxidizer is inorganic. 
     
     
       28. The method of  claim 24  wherein the oxidizer comprises NO x , where “x” is at least 1. 
     
     
       29. The method of  claim 24  wherein the oxidizer comprises NO.

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