P
US7790481B2ExpiredUtilityPatentIndex 51

Compound semiconductor light-emitting device and production method thereof

Assignee: SHOWA DENKO KKPriority: Mar 29, 2004Filed: May 15, 2008Granted: Sep 7, 2010
Est. expiryMar 29, 2024(expired)· nominal 20-yr term from priority
Inventors:TAKEUCHI RYOUICHINABEKURA WATARUUDAGAWA TAKASHI
H10W 72/9415H10W 72/07554H10W 72/952H10W 72/547H10W 72/90H10W 72/20H10W 72/944H10W 72/227H10W 72/07252H10H 20/018H10H 20/824H10H 20/013
51
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3
Claims

Abstract

A pn-junction compound semiconductor light-emitting device is provided, which comprises a stacked structure including a light-emitting layer composed of an n-type or a p-type aluminum gallium indium phosphide and a light-permeable substrate for supporting the stacked structure, and the stacked structure and the light-permeable substrate being joined together, wherein the stacked structure includes an n-type or a p-type conductor layer, the conductor layer and the substrate are joined together, and the conductor layer is composed of a Group III-V compound semiconductor containing boron.

Claims

exact text as granted — not AI-modified
1. A method for producing a pn-junction compound semiconductor light-emitting device comprising the steps of:
 forming a stacked structure through sequentially stacking on a crystal substrate a lower cladding layer, a light-emitting layer composed of n-type or p-type aluminum gallium indium phosphide, an upper cladding layer, and an n-type or a p-type conductor layer composed of an undoped boron-containing Group III-V compound semiconductor, and a step of joining the conductor layer to a light-permeable substrate; 
 wherein the crystal substrate is removed after joining of the conductor layer to the light-permeable substrate, and 
 wherein the conductor layer is formed though crystal growth at a growth rate of 20 nm/min to 30 nm/min and contains twins, having, as a twining plate, a (111) lattice plane of the boron containing Group III-V compound semiconductor. 
 
   
   
     2. The method for producing a pn-junction compound semiconductor light-emitting device according to  claim 1 , wherein the conductor layer is formed through crystal growth at a growth rate of 20 nm/min to 30 nm/min until the conductor layer thickness reaches 10 nm to 25 nm, followed by crystal growth at a growth rate less than 20 nm/min until the conductor layer comes to have a thickness of interest. 
   
   
     3. The method for producing a pn-junction compound semiconductor light-emitting device according to  claim 1 , wherein the conductor layer is composed of an undoped BP-based semiconductor.

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