Electronic device having a lead with selectively modified electrical properties

Abstract

A die package having a plurality of connection pads, a die substrate supporting a plurality of connection elements, a first lead having a first metal core with a first core diameter, and a dielectric layer surrounding the first metal core, the dielectric layer having a first dielectric thickness that varies along its length and/or the dielectric layer having an outer metal layer at least partially surrounding the dielectric layer, for selectively modifying the electrical characteristics of the lead.

Thus, having described the invention, what is claimed is: 
     
       1. A die package comprising:
 a die having a plurality of connection pads; 
 a die substrate supporting a plurality of connection elements; 
 a first lead having a first metal core attached to a connection pad of the die and to a connection element of the die substrate with a first core diameter, and a conformal dielectric layer surrounding the first metal core, the conformal dielectric layer having a first dielectric thickness that varies along the length of the first lead and the conformal dielectric layer having an outer metal layer surrounding the conformal dielectric layer, for selectively modifying the electrical characteristics of the lead, the conformal dielectric layer being patterned or structured to a predetermined depth, while a thin dielectric layer surrounding the first metal core is still left, in defined areas along the lead. 
 
     
     
       2. The die package of  claim 1 , including a second, thinner dielectric layer applied to the conformal dielectric layer. 
     
     
       3. The die package of  claim 1 , including a metal layer on the conformal dielectric layer, said metal layer being connected to a ground. 
     
     
       4. The die package of  claim 3 , wherein the metal is patterned for modifying the inductive characteristics of the lead. 
     
     
       5. The die package of  claim 1  comprising: phase matched first and second leads, said first lead having said first metal core with said first core diameter, and said conformal dielectric layer surrounding the first metal core having said first dielectric thickness, said second lead having a second metal core with a second core diameter, and a second dielectric layer surrounding the second metal core having a second dielectric thickness, with loop height of the first lead selected so that lead length of the first lead matches lead length of the second lead, despite a difference in straight line distance between respective connection pads on the die and connection elements on the die substrate. 
     
     
       6. The die package of  claim 5 , wherein the loop height of the first lead differs from the lead length of the second lead. 
     
     
       7. The die package of  claim 1 , wherein the dielectric layer and/or the metal layer is structured to create electromagnetic (EM) perturbations allowing for modifications of the electrical response as a function of frequency, in terms of attenuation and/or phase. 
     
     
       8. The die package of  claim 1 , wherein said die substrate includes filled via to allow formation of a BGA package. 
     
     
       9. The die package of  claim 1 , wherein said die substrate includes a leadframe to form a leadframe package. 
     
     
       10. The die package of  claim 2  configured for a ball grid array. 
     
     
       11. The die package of  claim 9  including configured for a leadframe package. 
     
     
       12. The die package of  claim 2 , including a metal layer on the conformal dielectric layer and the second, thinner dielectric layer, said metal layer being connected to a ground. 
     
     
       13. The die package of  claim 4  comprising: phase matched first and second leads, said first lead having said first metal core with said first core diameter, and said conformal dielectric layer surrounding the first metal core having said first dielectric thickness, said second lead having a second metal core with a second core diameter, and a second dielectric layer surrounding the second metal core having a second dielectric thickness, with loop height of the first lead selected so that lead length of the first lead matches lead length of the second lead, despite a difference in straight line distance between respective connection pads on the die and connection elements on the die substrate. 
     
     
       14. The die package of  claim 13 , wherein the conformal dielectric layer, or the combination of the conformal dielectric layer with the second, thinner dielectric layer, and /or the metal layer is structured to create electromagnetic (EM) perturbations allowing for modifications of the electrical response as a function of frequency, in terms of attenuation and/or phase. 
     
     
       15. The die package of  claim 14 , wherein said die substrate includes filled via to allow formation of a BGA package.