USD420927SExpiredUtility

IC test-head stand

Assignee: ADVANTEST CORPPriority: Dec 30, 1998Filed: Dec 30, 1998Granted: Feb 22, 2000
Est. expiryDec 30, 2018(expired)· nominal 20-yr term from priority
Inventors:Takayuki Yano
42
PatentIndex Score
4
Cited by
2
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an IC test-head stand, as shown and described.

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