USD420927SExpiredUtility
IC test-head stand
Est. expiryDec 30, 2018(expired)· nominal 20-yr term from priority
Inventors:Takayuki Yano
42
PatentIndex Score
4
Cited by
2
References
1
Claims
Claims
exact text as granted — not AI-modifiedThe ornamental design for an IC test-head stand, as shown and described.
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