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Three-dimensional measuring instrument

74
Assignee: TOPCON CORPPriority: Oct 30, 2006Filed: Apr 30, 2007Granted: Mar 4, 2008
Est. expiryOct 30, 2026(~0.3 yrs left)· nominal 20-yr term from priority
Inventors:Mitsuo Ishii
74
PatentIndex Score
19
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1
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Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a three-dimensional measuring instrument, as shown.

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