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Measuring device for measuring in three-dimension

78
Assignee: TOPCON CORPPriority: Oct 7, 2013Filed: Jan 24, 2014Granted: Mar 10, 2015
Est. expiryOct 7, 2033(~7.2 yrs left)· nominal 20-yr term from priority
Inventors:Mitsuo Ishii
78
PatentIndex Score
21
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5
References
1
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Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a measuring device for measuring in three-dimension, as shown and described.

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