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Socket for an electronic device testing apparatus

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Assignee: ADVANTEST CORPPriority: Jul 17, 2014Filed: Nov 24, 2014Granted: Jun 6, 2017
Est. expiryJul 17, 2034(~8 yrs left)· nominal 20-yr term from priority
Inventors:Takeshi OkushiMitsunori AizawaMasanori NagashimaTakashi Kawashima
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PatentIndex Score
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Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a socket for an electronic device testing apparatus, as shown and described.

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