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Socket for electronic device testing apparatus

60
Assignee: ADVANTEST CORPPriority: Mar 24, 2016Filed: Apr 5, 2016Granted: Sep 12, 2017
Est. expiryMar 24, 2036(~9.7 yrs left)· nominal 20-yr term from priority
Inventors:Takashi KawashimaShintaro Takaki
60
PatentIndex Score
10
Cited by
7
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       We claim the ornamental design for a socket for an electronic device testing apparatus, as shown and described.

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