USD819581SActiveUtility

Socket for electronic device testing apparatus

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Assignee: ADVANTEST CORPPriority: Jul 17, 2014Filed: Apr 21, 2017Granted: Jun 5, 2018
Est. expiryJul 17, 2034(~8 yrs left)· nominal 20-yr term from priority
Inventors:Takeshi OkushiMitsunori AizawaMasanori NagashimaTakashi Kawashima
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PatentIndex Score
1
Cited by
29
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a socket for an electronic device testing apparatus, as shown and described.

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