Assignee
X FAB SEMICONDUCTOR FOUNDRIES
DE·41 granted patents·20 pending applications·79 citations·filing 2003–2018
Top patents by PatentIndex Score
61 records- 0178US10186502B1Integrated circuit having a component provided by transfer print and method for making the integrated circuitX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Granted Jan 22, 2019·2 cites·26 claims
- 0277US11152504B2Methods of fabricating field-effect transistorsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2018·Granted Oct 19, 2021·2 cites·24 claims
- 0371US10446675B2Noff III-nitride high electron mobility transistorX FAB SEMICONDUCTOR FOUNDRIES·Filed 2018·Granted Oct 15, 2019·2 cites·12 claims
- 0470US10074681B2Light shield for light sensitive elementsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2016·Granted Sep 11, 2018·2 cites·13 claims
- 0567US8053897B2Production of a carrier wafer contact in trench insulated integrated SOI circuits having high-voltage componentsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Granted Nov 8, 2011·4 cites·18 claims
- 0667US7349070B2Multiple level photolithographyX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Granted Mar 25, 2008·2 cites·10 claims
- 0765US7625805B2Passivation of deep isolating separating trenches with sunk covering layersX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Granted Dec 1, 2009·4 cites·32 claims
- 0863US10622449B2Method of fabricating a tunnel oxide layer and a tunnel oxide layer for a semiconductor deviceX FAB SEMICONDUCTOR FOUNDRIES·Filed 2018·Granted Apr 14, 2020·1 cites·28 claims
- 0962US10181429B2Method for the formation of transistors PDSO1 and FDSO1 on a same substrateX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Granted Jan 15, 2019·1 cites·17 claims
- 1061US7509875B2Electrical determination of the connection quality of a bonded wafer connectionX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Granted Mar 31, 2009·2 cites·22 claims
- 1160US7588948B2Test structure for electrically verifying the depths of trench-etching in an SOI wafer, and associated working methodsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2004·Granted Sep 15, 2009·7 cites·27 claims
- 1256US8350209B2Production of self-organized pin-type nanostructures, and the rather extensive applications thereofX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Granted Jan 8, 2013·1 cites·9 claims
- 1354US8378451B2Capacitor and a method of manufacturing a capacitorX FAB SEMICONDUCTOR FOUNDRIES·Filed 2008·Granted Feb 19, 2013·1 cites·22 claims
- 1454US7989310B2Filling of insulation trenches using CMOS standard processes for creating dielectrically insulated areas on a SOI diskX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Granted Aug 2, 2011·3 cites·9 claims
- 1554US7790569B2Production of semiconductor substrates with buried layers by joining (bonding) semiconductor wafersX FAB SEMICONDUCTOR FOUNDRIES·Filed 2004·Granted Sep 7, 2010·7 cites·27 claims
- 1654US7598098B2Monitoring the reduction in thickness as material is removed from a wafer composite and test structure for monitoring removal of materialX FAB SEMICONDUCTOR FOUNDRIES·Filed 2004·Granted Oct 6, 2009·6 cites·19 claims
- 1754US7535074B2Monolithically integrated vertical pin photodiode used in biCMOS technologyX FAB SEMICONDUCTOR FOUNDRIES·Filed 2003·Granted May 19, 2009·7 cites·26 claims
- 1854US2018045764A1Semiconductor circuits, devices and methodsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Application pending·0 cites
- 1953US8021906B2Hermetic sealing and electrical contacting of a microelectromechanical structure, and microsystem (MEMS) produced therewithX FAB SEMICONDUCTOR FOUNDRIES·Filed 2007·Granted Sep 20, 2011·1 cites·33 claims
- 2052US11009529B2Semiconductor circuits, devices and methodsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Granted May 18, 2021·0 cites·15 claims
- 2152US7271074B2Trench insulation in substrate disks comprising logic semiconductors and power semiconductorsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2003·Granted Sep 18, 2007·6 cites·21 claims
- 2251US10388785B2LDMOS transistors for CMOS technologies and an associated production methodX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Granted Aug 20, 2019·0 cites·13 claims
- 2351US10014314B2Semiconductor device and methods of manufacture thereofX FAB SEMICONDUCTOR FOUNDRIES·Filed 2016·Granted Jul 3, 2018·1 cites·8 claims
- 2450US2018068872A1Carrier Substrate For Semiconductor Structures Suitable For A Transfer By Transfer Print And Manufacturing Of The Semiconductor Structures On The Carrier SubstrateX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Application pending·0 cites
- 2549US7195961B2SOI structure comprising substrate contacts on both sides of the box, and method for the production of such a structureX FAB SEMICONDUCTOR FOUNDRIES·Filed 2004·Granted Mar 27, 2007·8 cites·25 claims
- 2648US9153716B2Semiconductor component with a window opening as an interface for ambient couplingX FAB SEMICONDUCTOR FOUNDRIES·Filed 2014·Granted Oct 6, 2015·0 cites·17 claims
- 2747US9304104B2Ion sensitive field effect transistorX FAB SEMICONDUCTOR FOUNDRIES·Filed 2013·Granted Apr 5, 2016·0 cites·25 claims
- 2846US2010155910A1Method for the selective antireflection coating of a semiconductor interface by a particular process implementationX FAB SEMICONDUCTOR FOUNDRIES·Filed 2007·Application pending·0 cites
- 2944US2010252880A1Method of manufacturing a semiconductor device, and a semiconductor deviceX FAB SEMICONDUCTOR FOUNDRIES·Filed 2008·Application pending·0 cites
- 3044US2011182324A1Operating temperature measurement for an mos power component, and mos component for carrying out the methodX FAB SEMICONDUCTOR FOUNDRIES·Filed 2009·Application pending·0 cites
- 3144US2009113362A1Method for designing a mask for an integrated circuit having separate testing of design rules for different regions of a mask planeX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Application pending·0 cites
- 3244US2016126350A1Ldmos transistors for cmos technologies and an associated production methodX FAB SEMICONDUCTOR FOUNDRIES·Filed 2015·Application pending·0 cites
- 3343US7973385B2Semiconductor deviceX FAB SEMICONDUCTOR FOUNDRIES·Filed 2007·Granted Jul 5, 2011·0 cites·23 claims
- 3443US2010330506A1Method for transferring an epitaxial layer from a donor wafer to a system wafer appertaining to microsystems technologyX FAB SEMICONDUCTOR FOUNDRIES·Filed 2008·Application pending·0 cites
- 3543US2009294893A1Isolation trench intersection structure with reduced gap widthX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Application pending·0 cites
- 3642US10502631B2Thermopile test structure and methods employing sameX FAB SEMICONDUCTOR FOUNDRIES·Filed 2017·Granted Dec 10, 2019·0 cites·24 claims
- 3741US10151794B2Sleek serial interface for a wrapper boundary register (device and method)X FAB SEMICONDUCTOR FOUNDRIES·Filed 2014·Granted Dec 11, 2018·0 cites·31 claims
- 3841US7935606B2Transistor manufactureX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Granted May 3, 2011·0 cites·17 claims
- 3941US2010311248A1Structured layer deposition on processed wafers used in microsystem technologyX FAB SEMICONDUCTOR FOUNDRIES·Filed 2008·Application pending·0 cites
- 4041US2009090992A1Isolation trench structure for high electric strengthX FAB SEMICONDUCTOR FOUNDRIES·Filed 2006·Application pending·0 cites
- 4141US2010282165A1Production of adjustment structures for a structured layer deposition on a microsystem technology waferX FAB SEMICONDUCTOR FOUNDRIES·Filed 2008·Application pending·0 cites
- 4240US7517813B2Two-step oxidation process for semiconductor wafersX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Granted Apr 14, 2009·0 cites·19 claims
- 4340US2010213545A1Mos transistor with a p-field implant overlying each end of a gate thereofX FAB SEMICONDUCTOR FOUNDRIES·Filed 2008·Application pending·0 cites
- 4439US10068935B2Image lag free pixelX FAB SEMICONDUCTOR FOUNDRIES·Filed 2015·Granted Sep 4, 2018·0 cites·21 claims
- 4539US7989921B2Soi vertical bipolar power componentX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Granted Aug 2, 2011·0 cites·9 claims
- 4639US7746695B2Non-volatile semiconductor latch using hot-electron injection devicesX FAB SEMICONDUCTOR FOUNDRIES·Filed 2004·Granted Jun 29, 2010·6 cites·8 claims
- 4739US2009001434A1Vertical Pin or Nip Photodiode and Method for the Production which is Compatible with a Conventional Cmos-ProcessX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Application pending·0 cites
- 4839US2010059851A1Cmos circuits combining high voltage and rf technologiesX FAB SEMICONDUCTOR FOUNDRIES·Filed 2007·Application pending·0 cites
- 4937US7994806B2System and method for testing embedded circuits with test islandsX FAB SEMICONDUCTOR FOUNDRIES·Filed 2005·Granted Aug 9, 2011·1 cites·15 claims
- 5037US7485926B2SOI contact structuresX FAB SEMICONDUCTOR FOUNDRIES·Filed 2004·Granted Feb 3, 2009·2 cites·17 claims
Showing the top 50 of 61 patent records by PatentIndex Score.
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