Inventor · disambiguated record
Mitsuyoshi Miyazono
Also filed as: MIYAZONO MITSUYOSHI
4 granted patents·1 pending application·9 citations·filing 2007–2019
66Inventor score
Top patents by PatentIndex Score
5 records- 0165US10082524B2Prober in which probe head of probe card is replaced automaticallyTOKYO ELECTRON LTD·Filed 2014·Granted Sep 25, 2018·2 cites·12 claims
- 0263US8159245B2Holding member for inspection, inspection device and inspecting methodKOMATSU SHIGEKAZU·Filed 2007·Granted Apr 17, 2012·5 cites·10 claims
- 0361US8471585B2Method for evaluating semiconductor deviceMIYAZONO MITSUYOSHI·Filed 2010·Granted Jun 25, 2013·2 cites·6 claims
- 0443US9194906B2Probe apparatusTOKYO ELECTRON LTD·Filed 2013·Granted Nov 24, 2015·0 cites·5 claims
- 0543US2020049762A1Probe apparatus, probe inspection method, and storage mediumTOKYO ELECTRON LTD·Filed 2019·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →