Inventor · disambiguated record
Chia-Lung Chang
Also filed as: CHANG CHIA-LUNG
23 granted patents·3 pending applications·112 citations·filing 2011–2019
94Inventor score
Top patents by PatentIndex Score
26 records- 0195US8709901B1Method of forming an isolation structureUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 29, 2014·26 cites·16 claims
- 0293US10079277B2Method of fabricating metal-insulator-metal capacitorUNITED MICROELECTRONICS CORP·Filed 2016·Granted Sep 18, 2018·9 cites·12 claims
- 0391US10249706B1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 2, 2019·8 cites·11 claims
- 0491US8772904B2Semiconductor structure and process thereofLIU CHIH-CHIEN·Filed 2012·Granted Jul 8, 2014·12 cites·6 claims
- 0590US9754943B1Dynamic random access memory deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Sep 5, 2017·8 cites·15 claims
- 0690US8580625B2Metal oxide semiconductor transistor and method of manufacturing the sameLU TSUO-WEN·Filed 2011·Granted Nov 12, 2013·13 cites·26 claims
- 0788US8536038B2Manufacturing method for metal gate using ion implantationWang shao-wei·Filed 2011·Granted Sep 17, 2013·10 cites·35 claims
- 0886US10770464B2Semiconductor device including bit line structure of dynamic random access memory (DRAM) and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2018·Granted Sep 8, 2020·5 cites·6 claims
- 0985US10332888B2Memory devices and method of manufacturing the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jun 25, 2019·4 cites·18 claims
- 1081US10643883B2Method of forming isolation structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted May 5, 2020·3 cites·15 claims
- 1179US10672864B2Manufacturing method of semiconductor memory deviceUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jun 2, 2020·2 cites·9 claims
- 1279US8927388B2Method of fabricating dielectric layer and shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 2012·Granted Jan 6, 2015·4 cites·19 claims
- 1378US10276650B2Semiconductor memory device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 30, 2019·2 cites·10 claims
- 1471US10475900B2Method for manufacturing a semiconductor device with a cobalt silicide filmUNITED MICROELECTRONICS CORP·Filed 2018·Granted Nov 12, 2019·1 cites·9 claims
- 1571US10262895B2Method for forming semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Apr 16, 2019·1 cites·20 claims
- 1670US10535664B2Fabricating method of oxide layer within peripheral circuit regionUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 14, 2020·1 cites·13 claims
- 1766US9012300B2Manufacturing method for a shallow trench isolationUNITED MICROELECTRONICS CORP·Filed 2012·Granted Apr 21, 2015·2 cites·8 claims
- 1864US9034726B2Semiconductor processUNITED MICROELECTRONICS CORP·Filed 2014·Granted May 19, 2015·1 cites·11 claims
- 1963US10790289B2Method of forming a stop layer filling in a space between spacersUNITED MICROELECTRONICS CORP·Filed 2019·Granted Sep 29, 2020·0 cites·8 claims
- 2057US10468417B2Semiconductor structure with a conductive line and fabricating method of a stop layerUNITED MICROELECTRONICS CORP·Filed 2018·Granted Nov 5, 2019·0 cites·8 claims
- 2149US10903328B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 26, 2021·0 cites·4 claims
- 2249US2014035070A1Metal oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 2348US10811272B2Method of forming stacked structure of memoryUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 20, 2020·0 cites·15 claims
- 2448US10312080B2Method for forming amorphous silicon multuple layer structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jun 4, 2019·0 cites·13 claims
- 2541US2014213034A1Method for forming isolation structureUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 2638US2018190662A1Bit line gate structure of dynamic random access memory (dram) and forming method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Application pending·0 cites
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