Inventor
IYER SUBRAMANIAN S
US102 patents
⚠️ This page may combine multiple inventors who share the name “IYER SUBRAMANIAN S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
37 patentsUS7696000B2Apr 13, 2010
Low defect Si:C layer with retrograde carbon profile
IBM124 citations98
US6261876B1Jul 17, 2001
Planar mixed SOI-bulk substrate for microelectronic applications
IBM93 citations98
US5310451AMay 10, 1994
Method of forming an ultra-uniform silicon-on-insulator layer
IBM121 citations98
US6096580AAug 1, 2000
Low programming voltage anti-fuse
IBM99 citations97
US5461243AOct 24, 1995
Substrate for tensilely strained semiconductor
IBM387 citations97
US7276751B2Oct 2, 2007
Trench metal-insulator-metal (MIM) capacitors integrated with middle-of-line metal contacts, and method of fabricating same
IBM50 citations96
US6287913B1Sep 11, 2001
Double polysilicon process for providing single chip high performance logic and compact embedded memory structure
IBM76 citations96
US5525828AJun 11, 1996
High speed silicon-based lateral junction photodetectors having recessed electrodes and thick oxide to reduce fringing fields
IBM138 citations95
US5268324ADec 7, 1993
Modified silicon CMOS process having selectively deposited Si/SiGe FETS
IBM79 citations95
US7982285B2Jul 19, 2011
Antifuse structure having an integrated heating element
IBM14 citations93
US7388244B2Jun 17, 2008
Trench metal-insulator-metal (MIM) capacitors and method of fabricating same
IBM21 citations93
US7193262B2Mar 20, 2007
Low-cost deep trench decoupling capacitor device and process of manufacture
IBM26 citations93
US6507511B1Jan 14, 2003
Secure and dense SRAM cells in EDRAM technology
IBM26 citations93
US4997246AMar 5, 1991
Silicon-based rib waveguide optical modulator
IBM78 citations93
US4638347AJan 20, 1987
Gate electrode sidewall isolation spacer for field effect transistors
IBM46 citations93
US4617087AOct 14, 1986
Method for differential selective deposition of metal for fabricating metal contacts in integrated semiconductor circuits
IBM52 citations93
US9038133B2May 19, 2015
Self-authenticating of chip based on intrinsic features
IBM24 citations92
US9025386B1May 5, 2015
Embedded charge trap multi-time-programmable-read-only-memory for high performance logic technology
IBM27 citations92
US7411818B1Aug 12, 2008
Programmable fuse/non-volatile memory structures using externally heated phase change material
IBM50 citations92
US6747890B1Jun 8, 2004
Gain cell structure with deep trench capacitor
IBM35 citations92
US6686617B2Feb 3, 2004
Semiconductor chip having both compact memory and high performance logic
IBM36 citations92
US6436760B1Aug 20, 2002
Method for reducing surface oxide in polysilicon processing
IBM23 citations92
US5501787AMar 26, 1996
Immersion scanning system for fabricating porous silicon films
IBM33 citations92
US5463254AOct 31, 1995
Formation of 3-dimensional silicon silicide structures
IBM24 citations92
US5264387ANov 23, 1993
Method of forming uniformly thin, isolated silicon mesas on an insulating substrate
IBM27 citations92
US6339228B1Jan 15, 2002
DRAM cell buried strap leakage measurement structure and method
IBM45 citations88
US9690927B2Jun 27, 2017
Providing an authenticating service of a chip
IBM11 citations84
US9588937B2Mar 7, 2017
Array of processor core circuits with reversible tiers
IBM7 citations84
US9208878B2Dec 8, 2015
Non-volatile memory based on retention modulation
IBM19 citations84
US8822141B1Sep 2, 2014
Front side wafer ID processing
IBM10 citations84
US7939369B2May 10, 2011
3D integration structure and method using bonded metal planes
IBM14 citations84
US7880266B2Feb 1, 2011
Four-terminal antifuse structure having integrated heating elements for a programmable circuit
IBM8 citations84
US7750388B2Jul 6, 2010
Trench metal-insulator metal (MIM) capacitors
IBM12 citations84
US7732893B2Jun 8, 2010
Electrical fuse structure for higher post-programming resistance
IBM10 citations84
US7227207B2Jun 5, 2007
Dense semiconductor fuse array
IBM11 citations84
US6821857B1Nov 23, 2004
High on-current device for high performance embedded DRAM (eDRAM) and method of forming the same
IBM14 citations84
US9431339B2Aug 30, 2016
Wiring structure for trench fuse component with methods of fabrication
IBM5 citations82
FAROOQ MUKTA G
6 patentsUS8158515B2Apr 17, 2012
Method of making 3D integrated circuits
FAROOQ MUKTA G281 citations99
US8129256B2Mar 6, 2012
3D integrated circuit device fabrication with precisely controllable substrate removal
FAROOQ MUKTA G254 citations99
US9406561B2Aug 2, 2016
Three dimensional integrated circuit integration using dielectric bonding first and through via formation last
FAROOQ MUKTA G19 citations84
US8674515B2Mar 18, 2014
3D integrated circuits structure
FAROOQ MUKTA G11 citations84
US8492869B2Jul 23, 2013
3D integrated circuit device having lower-cost active circuitry layers stacked before higher-cost active circuitry layer
FAROOQ MUKTA G5 citations84
US8298914B2Oct 30, 2012
3D integrated circuit device fabrication using interface wafer as permanent carrier
FAROOQ MUKTA G7 citations84
MOTOROLA INC
1 patentSIBOND L L C
1 patentGLOBALFOUNDRIES INC
1 patent(unassigned)
1 patentSI BOND LLC
1 patentGLOBALFOUNDRIES US 2 LLC
1 patentANDRY PAUL S
1 patentShowing the top 50 of 102 patents by PatentIndex Score.