Inventor · disambiguated record
Takashi Amemiya
Also filed as: AMEMIYA TAKASHI
18 granted patents·4 pending applications·193 citations·filing 1991–2017
93Inventor score
Top patents by PatentIndex Score
22 records- 0192US5248567APower generation plant including fuel cellTOSHIBA KK·Filed 1992·Granted Sep 28, 1993·98 cites·26 claims
- 0288US7267551B2Inspection contact structure and probe cardTOKYO ELECTRON LTD·Filed 2005·Granted Sep 11, 2007·11 cites·8 claims
- 0380US7719296B2Inspection contact structure and probe cardTOKYO ELECTRON LTD·Filed 2007·Granted May 18, 2010·5 cites·6 claims
- 0465US7541820B2Probe cardTOKYO ELECTRON LTD·Filed 2006·Granted Jun 2, 2009·2 cites·2 claims
- 0564US8063652B2Probing apparatus and method for adjusting probing apparatusAMEMIYA TAKASHI·Filed 2006·Granted Nov 22, 2011·4 cites·11 claims
- 0662US7679385B2Probe card for inspecting electric properties of an objectTOKYO ELECTRON LTD·Filed 2007·Granted Mar 16, 2010·2 cites·20 claims
- 0759US5178969AFuel cell powerplant systemTOSHIBA KK·Filed 1991·Granted Jan 12, 1993·27 cites·7 claims
- 0858US10908180B2Probe card case and probe card transfer methodJAPAN ELECTRONIC MATERIALS·Filed 2017·Granted Feb 2, 2021·0 cites·9 claims
- 0955US7701234B2Inspection contact structure and probe cardTOKYO ELECTRON LTD·Filed 2007·Granted Apr 20, 2010·0 cites·6 claims
- 1055US5085949AFuel cell generation systemTOSHIBA KK·Filed 1991·Granted Feb 4, 1992·24 cites·4 claims
- 1154US10184954B2Probe card case and probe card transfer methodJAPAN ELECTRONIC MATERIALS·Filed 2013·Granted Jan 22, 2019·0 cites·6 claims
- 1250US5639390AConductor pattern check apparatus for locating and repairing open circuitsTOKYO ELECTRON LTD·Filed 1994·Granted Jun 17, 1997·10 cites·6 claims
- 1342US9671452B2Substrate inspection apparatus and probe card transferring methodTOKYO ELECTRON LTD·Filed 2015·Granted Jun 6, 2017·0 cites·10 claims
- 1442US7692435B2Probe card and probe device for inspection of a semiconductor deviceTOKYO ELECTRON LTD·Filed 2007·Granted Apr 6, 2010·0 cites·8 claims
- 1542US5844199AConductor pattern check apparatus for locating and repairing short and open circuitsTOKYO ELECTRON LTD·Filed 1997·Granted Dec 1, 1998·8 cites·6 claims
- 1640US2013099813A1Contact terminal for a probe card, and the probe cardTOKYO ELECTRON LTD·Filed 2012·Application pending·0 cites
- 1739US2009171000A1Epdm CompositionAMEMIYA TAKASHI·Filed 2006·Application pending·0 cites
- 1838US2009015281A1Method of positioning an anisotropic conductive connector, method of positioning the anisotropic conductive connector and a circuit board for inspection, anisotropic conductive connector, and probe cardJSR CORP·Filed 2008·Application pending·0 cites
- 1937US6759469B2Butyl rubber compositionNOK CORP·Filed 2001·Granted Jul 6, 2004·0 cites·16 claims
- 2035USD751555SProbe card caseTOKYO ELECTRON LTD·Filed 2013·Granted Mar 15, 2016·2 cites·1 claims
- 2134US2008048698A1Probe CardAMEMIYA TAKASHI·Filed 2005·Application pending·0 cites
- 2232US7199198B2Fluororubber base sealant composition and fluororubber base sealantNOK CORP·Filed 2004·Granted Apr 3, 2007·0 cites·11 claims
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