Inventor · disambiguated record
Uday Nayak
Also filed as: NAYAK UDAY · NAYAK UDAY G
13 granted patents·1 pending application·1,005 citations·filing 1994–2012
93Inventor score
Top patents by PatentIndex Score
14 records- 0198US5623853APrecision motion stage with single guide beam and follower stageNIKON PRECISION INC·Filed 1994·Granted Apr 29, 1997·798 cites·32 claims
- 0289US6134981APrecision scanning apparatus and method with fixed and movable guide membersNIPPON KOGAKU KK·Filed 1999·Granted Oct 24, 2000·67 cites·8 claims
- 0388US7352198B2Methods and apparatuses for improved stabilization in a probing systemELECTROGLAS INC·Filed 2006·Granted Apr 1, 2008·13 cites·90 claims
- 0488US5996437APrecision motion stage with single guide beam and follower stageNIKON CORP·Filed 1997·Granted Dec 7, 1999·62 cites·4 claims
- 0586US6363809B1Precision scanning apparatus and method with fixed and movable guide membersNIKON CORP JAPAN·Filed 2000·Granted Apr 2, 2002·32 cites·9 claims
- 0677US7368929B2Methods and apparatuses for improved positioning in a probing systemELECTROGLAS INC·Filed 2006·Granted May 6, 2008·6 cites·18 claims
- 0776US7345466B2Method and apparatus for cleaning a probe cardELECTROGLAS INC·Filed 2005·Granted Mar 18, 2008·8 cites·14 claims
- 0875US7622939B2Methods and apparatuses for improved stabilization in a probing systemNAYAK UDAY·Filed 2007·Granted Nov 24, 2009·5 cites·25 claims
- 0972US8120304B2Method for improving motion times of a stageYALEI SUN·Filed 2008·Granted Feb 21, 2012·7 cites·25 claims
- 1056US8519728B2Compliance control methods and apparatusesYALEI SUN·Filed 2008·Granted Aug 27, 2013·3 cites·23 claims
- 1156US7362116B1Method for probing impact sensitive and thin layered substrateELECTROGLAS INC·Filed 2005·Granted Apr 22, 2008·4 cites·16 claims
- 1247US8310195B2Method for improving motion times of a stageYALEI SUN·Filed 2012·Granted Nov 13, 2012·0 cites·25 claims
- 1347US7852097B2Methods and apparatuses for improved positioning in a probing systemNAYAK UDAY·Filed 2008·Granted Dec 14, 2010·0 cites·2 claims
- 1432US2008150559A1Method for probing impact sensitve and thin layered substrateNAYAK UDAY·Filed 2008·Application pending·0 cites
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