Inventor · disambiguated record
Saibal Banerjee
Also filed as: BANERJEE SAIBAL
19 granted patents·2 pending applications·579 citations·filing 2000–2020
94Inventor score
Top patents by PatentIndex Score
21 records- 0196US9816939B2Virtual inspection systems with multiple modesKLA TENCOR CORP·Filed 2015·Granted Nov 14, 2017·29 cites·30 claims
- 0295US10181185B2Image based specimen process controlKLA TENCOR CORP·Filed 2017·Granted Jan 15, 2019·21 cites·35 claims
- 0395US9098891B2Adaptive sampling for semiconductor inspection recipe creation, defect review, and metrologyKLA TENCOR CORP·Filed 2014·Granted Aug 4, 2015·27 cites·67 claims
- 0494US8241573B2Systems and devices for sequence by synthesis analysisBANERJEE SAIBAL·Filed 2007·Granted Aug 14, 2012·299 cites·54 claims
- 0594US6999614B1Power assisted automatic supervised classifier creation tool for semiconductor defectsKLA TENCOR CORP·Filed 2000·Granted Feb 14, 2006·126 cites·46 claims
- 0692US10416088B2Virtual inspection systems with multiple modesKLA TENCOR CORP·Filed 2017·Granted Sep 17, 2019·7 cites·30 claims
- 0789US7747062B2Methods, defect review tools, and systems for locating a defect in a defect review processKLA TENCOR TECH CORP·Filed 2005·Granted Jun 29, 2010·32 cites·30 claims
- 0888US8396066B1Routing table for non-uniform random neighbor selectionBANERJEE SAIBAL·Filed 2009·Granted Mar 12, 2013·19 cites·19 claims
- 0982US9965848B2Shape based groupingKLA TENCOR CORP·Filed 2016·Granted May 8, 2018·4 cites·20 claims
- 1082US8432830B1Multi-neighbor proportional forwarding in a networkBANERJEE SAIBAL·Filed 2009·Granted Apr 30, 2013·10 cites·18 claims
- 1174US10127651B2Defect sensitivity of semiconductor wafer inspectors using design data with wafer image dataKLA TENCOR CORP·Filed 2016·Granted Nov 13, 2018·2 cites·20 claims
- 1269US10503078B2Criticality analysis augmented process window qualification samplingKLA TENCOR CORP·Filed 2018·Granted Dec 10, 2019·1 cites·18 claims
- 1365US9767548B2Outlier detection on pattern of interest image populationsKLA TENCOR CORP·Filed 2016·Granted Sep 19, 2017·1 cites·30 claims
- 1457US11410291B2System and method for generation of wafer inspection critical areasKLA CORP·Filed 2020·Granted Aug 9, 2022·0 cites·26 claims
- 1547US10714366B2Shape metric based scoring of wafer locationsKLA TENCOR CORP·Filed 2019·Granted Jul 14, 2020·0 cites·31 claims
- 1647US8767734B1Stream basis set division multiplexingKONDEPUDY RAGHAVA·Filed 2009·Granted Jul 1, 2014·0 cites·21 claims
- 1747US7822026B2Transit devices and system including a slow protocol filter and methods of transmitting information within a transit device or system using a slow protocol filterALLIED TELESIS INC·Filed 2005·Granted Oct 26, 2010·1 cites·19 claims
- 1846US10706522B2System and method for generation of wafer inspection critical areasKLA TENCOR CORP·Filed 2016·Granted Jul 7, 2020·0 cites·32 claims
- 1943US2014303912A1System and method for the automatic determination of critical parametric electrical test parameters for inline yield monitoringKLA TENCOR CORP·Filed 2014·Application pending·0 cites
- 2040US10074167B2Reducing registration and design vicinity induced noise for intra-die inspectionKLA TENCOR CORP·Filed 2016·Granted Sep 11, 2018·0 cites·18 claims
- 2136US2010254381A1Transit devices and system including a slow protocol filter and methods of transmitting information within a transit device or system using a slow protocol filterALLIED TELESYN INC·Filed 2010·Application pending·0 cites
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