Inventor · disambiguated record
Joseph K. V. Comeau
Also filed as: COMEAU JOSEPH K · COMEAU JOSEPH K V · COMEAU JOSEPH KERRY VAUGHN
15 granted patents·1 pending application·394 citations·filing 2003–2017
89Inventor score
Top patents by PatentIndex Score
16 records- 0193US9057388B2Vacuum trapCOMEAU JOSEPH K·Filed 2012·Granted Jun 16, 2015·386 cites·40 claims
- 0275US7824568B2Solution for forming polishing slurry, polishing slurry and related methodsIBM·Filed 2006·Granted Nov 2, 2010·2 cites·7 claims
- 0362US7888142B2Copper contamination detection method and system for monitoring copper contaminationIBM·Filed 2007·Granted Feb 15, 2011·1 cites·15 claims
- 0460US10571490B2Solder bump array probe tip structure for laser cleaningIBM·Filed 2017·Granted Feb 25, 2020·0 cites·16 claims
- 0559US8734665B2Slurry for chemical-mechanical polishing of copper and use thereofBATES GRAHAM M·Filed 2011·Granted May 27, 2014·1 cites·19 claims
- 0654US9835653B2Solder bump array probe tip structure for laser cleaningIBM·Filed 2014·Granted Dec 5, 2017·0 cites·13 claims
- 0753US7442552B2Pressurized oxygen for evaluation of molding compound stability in semiconductor packagingIBM·Filed 2007·Granted Oct 28, 2008·1 cites·3 claims
- 0851US9847213B2Vacuum trapGLOBALFOUNDRIES INC·Filed 2015·Granted Dec 19, 2017·0 cites·19 claims
- 0951US8636917B2Solution for forming polishing slurry, polishing slurry and related methodsCOMEAU JOSEPH K V·Filed 2010·Granted Jan 28, 2014·0 cites·10 claims
- 1050US9708508B2Slurry for chemical-mechanical polishing of metals and use thereofGLOBALFOUNDRIES INC·Filed 2015·Granted Jul 18, 2017·0 cites·16 claims
- 1149US8328892B2Solution for forming polishing slurry, polishing slurry and related methodsCOMEAU JOSEPH K V·Filed 2007·Granted Dec 11, 2012·0 cites·12 claims
- 1247US9057004B2Slurry for chemical-mechanical polishing of metals and use thereofBATES GRAHAM M·Filed 2011·Granted Jun 16, 2015·0 cites·18 claims
- 1347US7300796B2Pressurized oxygen for evaluation of molding compound stability in semiconductor packagingIBM·Filed 2003·Granted Nov 27, 2007·3 cites·39 claims
- 1445US7957917B2Copper contamination detection method and system for monitoring copper contaminationIBM·Filed 2007·Granted Jun 7, 2011·0 cites·18 claims
- 1541US2009064763A1Pressurized oxygen for evaluation of molding compound stability in semiconductor packagingCOMEAU JOSEPH K V·Filed 2008·Application pending·0 cites
- 1640US8236580B2Copper contamination detection method and system for monitoring copper contaminationBURNHAM JAY SANFORD·Filed 2010·Granted Aug 7, 2012·0 cites·16 claims
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